820 mV open-circuit voltages from Cu2O/CH3CN junctions

Chengxiang Xiang, Gregory M. Kimball, Ronald L. Grimm, Bruce S. Brunschwig, Harry A. Atwater, Nathan S Lewis

Research output: Contribution to journalArticle

59 Citations (Scopus)

Abstract

P-Type cuprous oxide (Cu2O) photoelectrodes prepared by the thermal oxidation of Cu foils exhibited open-circuit voltages in excess of 800 mV in nonaqueous regenerative photoelectrochemical cells. In contact with the decamethylcobaltocene+/0 (Me10CoCp2 +/0) redox couple, cuprous oxide yielded open-circuit voltage, V oc, values of 820 mV and short-circuit current density, J sc, values of 3.1 mA cm-2 under simulated air mass 1.5 illumination. The energy-conversion efficiency of 1.5% was limited by solution absorption and optical reflection losses that reduced the short-circuit photocurrent density. Spectral response measurements demonstrated that the internal quantum yield approached unity in the 400-500 nm spectral range, but poor red response, attributable to bulk recombination, lowered the overall efficiency of the cell. X-Ray photoelectron spectroscopy and Auger electron spectroscopy indicated that the photoelectrodes had a high-quality cuprous oxide surface, and revealed no observable photocorrosion during operation in the nonaqueous electrolyte. The semiconductor/liquid junctions thus provide a noninvasive method to investigate the energy-conversion properties of cuprous oxide without the confounding factors of deleterious surface reactions.

Original languageEnglish
Pages (from-to)1311-1318
Number of pages8
JournalEnergy and Environmental Science
Volume4
Issue number4
DOIs
Publication statusPublished - Apr 2011

Fingerprint

Open circuit voltage
oxide
Oxides
Energy conversion
Short circuit currents
Photoelectrochemical cells
Surface reactions
Quantum yield
Auger electron spectroscopy
Photocurrents
density current
air mass
electrolyte
Metal foil
Electrolytes
X-ray spectroscopy
recombination
Conversion efficiency
Current density
X ray photoelectron spectroscopy

ASJC Scopus subject areas

  • Renewable Energy, Sustainability and the Environment
  • Environmental Chemistry
  • Pollution
  • Nuclear Energy and Engineering

Cite this

Xiang, C., Kimball, G. M., Grimm, R. L., Brunschwig, B. S., Atwater, H. A., & Lewis, N. S. (2011). 820 mV open-circuit voltages from Cu2O/CH3CN junctions. Energy and Environmental Science, 4(4), 1311-1318. https://doi.org/10.1039/c0ee00554a

820 mV open-circuit voltages from Cu2O/CH3CN junctions. / Xiang, Chengxiang; Kimball, Gregory M.; Grimm, Ronald L.; Brunschwig, Bruce S.; Atwater, Harry A.; Lewis, Nathan S.

In: Energy and Environmental Science, Vol. 4, No. 4, 04.2011, p. 1311-1318.

Research output: Contribution to journalArticle

Xiang, C, Kimball, GM, Grimm, RL, Brunschwig, BS, Atwater, HA & Lewis, NS 2011, '820 mV open-circuit voltages from Cu2O/CH3CN junctions', Energy and Environmental Science, vol. 4, no. 4, pp. 1311-1318. https://doi.org/10.1039/c0ee00554a
Xiang C, Kimball GM, Grimm RL, Brunschwig BS, Atwater HA, Lewis NS. 820 mV open-circuit voltages from Cu2O/CH3CN junctions. Energy and Environmental Science. 2011 Apr;4(4):1311-1318. https://doi.org/10.1039/c0ee00554a
Xiang, Chengxiang ; Kimball, Gregory M. ; Grimm, Ronald L. ; Brunschwig, Bruce S. ; Atwater, Harry A. ; Lewis, Nathan S. / 820 mV open-circuit voltages from Cu2O/CH3CN junctions. In: Energy and Environmental Science. 2011 ; Vol. 4, No. 4. pp. 1311-1318.
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