A scanning probe microscopy study of the (001) surfaces of V2O5 and V6O13

Richard L. Smith, Gregory S. Rohrer, K. S. Lee, Dong Kyun Seo, M. H. Whangbo

Research output: Contribution to journalArticle

47 Citations (Scopus)

Abstract

Single crystals of V2O5(001) and V6O13(001) were imaged in ambient conditions by scanning tunneling microscopy (STM) and atomic force microscopy (AFM). Atomic-scale resolution images are compared with partial and total electron-density plots of the surface calculated using the extended Hückel tight-binding electronic band-structure method. The V2O5(001) surface is terminated by vanadyl O atoms that dominate the contrast in both AFM and STM images. The V6O13(001) surface, on the other hand, is terminated by a V-O plane and the contrast in both AFM and STM images is dominated by the V atoms.

Original languageEnglish
Pages (from-to)87-95
Number of pages9
JournalSurface Science
Volume367
Issue number1
DOIs
Publication statusPublished - Nov 10 1996

Fingerprint

Scanning probe microscopy
Scanning tunneling microscopy
scanning tunneling microscopy
Atomic force microscopy
atomic force microscopy
microscopy
scanning
probes
Atoms
Vanadates
image resolution
Image resolution
Band structure
Carrier concentration
atoms
plots
Single crystals
single crystals
electronics
vanadium pentoxide

Keywords

  • Atomic Force Microscopy
  • Scanning Tunneling Microscopy
  • Surface Structure
  • Vanadium oxide

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

A scanning probe microscopy study of the (001) surfaces of V2O5 and V6O13. / Smith, Richard L.; Rohrer, Gregory S.; Lee, K. S.; Seo, Dong Kyun; Whangbo, M. H.

In: Surface Science, Vol. 367, No. 1, 10.11.1996, p. 87-95.

Research output: Contribution to journalArticle

Smith, Richard L. ; Rohrer, Gregory S. ; Lee, K. S. ; Seo, Dong Kyun ; Whangbo, M. H. / A scanning probe microscopy study of the (001) surfaces of V2O5 and V6O13. In: Surface Science. 1996 ; Vol. 367, No. 1. pp. 87-95.
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