Accurate thickness/density measurements of organic light-emitting diodes

C. H.M. Marée; R. A. Weller; L. C. Feldman; K. Pakbaz; H. W.H. Lee

doi:10.1063/1.368582

Accurate thickness/density measurements of organic light-emitting diodes

C. H.M. Marée, R. A. Weller, L. C. Feldman, K. Pakbaz, H. W.H. Lee

Rutgers University

Research output: Contribution to journal › Article › peer-review

23 Citations (Scopus)

Abstract

We report on the use of Rutherford backscattering spectroscopy for thickness analysis of organic light-emitting diode structures (OLEDs) with subnanometer resolution and a spatial resolution <1 mm. A careful study of ion beam induced effects revealed some organic film degradation, but not so severe as to inhibit meaningful measurements. The method is independent of the substrate and is still applicable if the organic film is capped with a metal cathode. Common OLED materials have been the subject of this study: poly(2-methoxy,5-(2′-ethylhexoxy)-1,4-phenylene-vinylene (MEH-PPV), N′ ,N′ -diphenyl-N, N′ -bis(3-methylphenyl)-1,1′ biphenyl-4,4′-diamine (TPD), and tris-(8-hydroxyquinoline) aluminum (Alq₃). The densities of thin films of evaporated TPD (ρ =1.22±0.05 g/cm³) and Alq₃ (ρ=1.51±0.03 g/cm³) have been established.

Original language	English
Pages (from-to)	4013-4016
Number of pages	4
Journal	Journal of Applied Physics
Volume	84
Issue number	7
DOIs	https://doi.org/10.1063/1.368582
Publication status	Published - Oct 1 1998

ASJC Scopus subject areas

Physics and Astronomy(all)

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abstract = "We report on the use of Rutherford backscattering spectroscopy for thickness analysis of organic light-emitting diode structures (OLEDs) with subnanometer resolution and a spatial resolution <1 mm. A careful study of ion beam induced effects revealed some organic film degradation, but not so severe as to inhibit meaningful measurements. The method is independent of the substrate and is still applicable if the organic film is capped with a metal cathode. Common OLED materials have been the subject of this study: poly(2-methoxy,5-(2′-ethylhexoxy)-1,4-phenylene-vinylene (MEH-PPV), N′ ,N′ -diphenyl-N, N′ -bis(3-methylphenyl)-1,1′ biphenyl-4,4′-diamine (TPD), and tris-(8-hydroxyquinoline) aluminum (Alq3). The densities of thin films of evaporated TPD (ρ =1.22±0.05 g/cm3) and Alq3 (ρ=1.51±0.03 g/cm3) have been established.",

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AU - Pakbaz, K.

AU - Lee, H. W.H.

PY - 1998/10/1

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N2 - We report on the use of Rutherford backscattering spectroscopy for thickness analysis of organic light-emitting diode structures (OLEDs) with subnanometer resolution and a spatial resolution <1 mm. A careful study of ion beam induced effects revealed some organic film degradation, but not so severe as to inhibit meaningful measurements. The method is independent of the substrate and is still applicable if the organic film is capped with a metal cathode. Common OLED materials have been the subject of this study: poly(2-methoxy,5-(2′-ethylhexoxy)-1,4-phenylene-vinylene (MEH-PPV), N′ ,N′ -diphenyl-N, N′ -bis(3-methylphenyl)-1,1′ biphenyl-4,4′-diamine (TPD), and tris-(8-hydroxyquinoline) aluminum (Alq3). The densities of thin films of evaporated TPD (ρ =1.22±0.05 g/cm3) and Alq3 (ρ=1.51±0.03 g/cm3) have been established.

AB - We report on the use of Rutherford backscattering spectroscopy for thickness analysis of organic light-emitting diode structures (OLEDs) with subnanometer resolution and a spatial resolution <1 mm. A careful study of ion beam induced effects revealed some organic film degradation, but not so severe as to inhibit meaningful measurements. The method is independent of the substrate and is still applicable if the organic film is capped with a metal cathode. Common OLED materials have been the subject of this study: poly(2-methoxy,5-(2′-ethylhexoxy)-1,4-phenylene-vinylene (MEH-PPV), N′ ,N′ -diphenyl-N, N′ -bis(3-methylphenyl)-1,1′ biphenyl-4,4′-diamine (TPD), and tris-(8-hydroxyquinoline) aluminum (Alq3). The densities of thin films of evaporated TPD (ρ =1.22±0.05 g/cm3) and Alq3 (ρ=1.51±0.03 g/cm3) have been established.

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Accurate thickness/density measurements of organic light-emitting diodes

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