TY - JOUR
T1 - Accurate thickness/density measurements of organic light-emitting diodes
AU - Marée, C. H.M.
AU - Weller, R. A.
AU - Feldman, L. C.
AU - Pakbaz, K.
AU - Lee, H. W.H.
PY - 1998/10/1
Y1 - 1998/10/1
N2 - We report on the use of Rutherford backscattering spectroscopy for thickness analysis of organic light-emitting diode structures (OLEDs) with subnanometer resolution and a spatial resolution <1 mm. A careful study of ion beam induced effects revealed some organic film degradation, but not so severe as to inhibit meaningful measurements. The method is independent of the substrate and is still applicable if the organic film is capped with a metal cathode. Common OLED materials have been the subject of this study: poly(2-methoxy,5-(2′-ethylhexoxy)-1,4-phenylene-vinylene (MEH-PPV), N′ ,N′ -diphenyl-N, N′ -bis(3-methylphenyl)-1,1′ biphenyl-4,4′-diamine (TPD), and tris-(8-hydroxyquinoline) aluminum (Alq3). The densities of thin films of evaporated TPD (ρ =1.22±0.05 g/cm3) and Alq3 (ρ=1.51±0.03 g/cm3) have been established.
AB - We report on the use of Rutherford backscattering spectroscopy for thickness analysis of organic light-emitting diode structures (OLEDs) with subnanometer resolution and a spatial resolution <1 mm. A careful study of ion beam induced effects revealed some organic film degradation, but not so severe as to inhibit meaningful measurements. The method is independent of the substrate and is still applicable if the organic film is capped with a metal cathode. Common OLED materials have been the subject of this study: poly(2-methoxy,5-(2′-ethylhexoxy)-1,4-phenylene-vinylene (MEH-PPV), N′ ,N′ -diphenyl-N, N′ -bis(3-methylphenyl)-1,1′ biphenyl-4,4′-diamine (TPD), and tris-(8-hydroxyquinoline) aluminum (Alq3). The densities of thin films of evaporated TPD (ρ =1.22±0.05 g/cm3) and Alq3 (ρ=1.51±0.03 g/cm3) have been established.
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U2 - 10.1063/1.368582
DO - 10.1063/1.368582
M3 - Article
AN - SCOPUS:0005242958
VL - 84
SP - 4013
EP - 4016
JO - Journal of Applied Physics
JF - Journal of Applied Physics
SN - 0021-8979
IS - 7
ER -