Abstract
The crystal orientation of an exfoliated black phosphorous flake is determined by purely electrical means. A sequence of three resistance measurements on an arbitrarily shaped flake with five contacts determines the three independent components of the anisotropic in-plane resistivity tensor, thereby revealing the crystal axes. The resistivity anisotropy ratio decreases linearly with increasing temperature T and carrier density reaching a maximum ratio of 3.0 at low temperatures and densities, while mobility indicates impurity scattering at low T and acoustic phonon scattering at high T.
| Original language | English |
|---|---|
| Article number | 086801 |
| Journal | Physical Review Letters |
| Volume | 120 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - Feb 21 2018 |
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ASJC Scopus subject areas
- Physics and Astronomy(all)
Cite this
All-Electrical Determination of Crystal Orientation in Anisotropic Two-Dimensional Materials. / Peng, Lintao; Wells, Spencer A.; Ryder, Christopher R.; Hersam, Mark C; Grayson, Matthew.
In: Physical Review Letters, Vol. 120, No. 8, 086801, 21.02.2018.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - All-Electrical Determination of Crystal Orientation in Anisotropic Two-Dimensional Materials
AU - Peng, Lintao
AU - Wells, Spencer A.
AU - Ryder, Christopher R.
AU - Hersam, Mark C
AU - Grayson, Matthew
PY - 2018/2/21
Y1 - 2018/2/21
N2 - The crystal orientation of an exfoliated black phosphorous flake is determined by purely electrical means. A sequence of three resistance measurements on an arbitrarily shaped flake with five contacts determines the three independent components of the anisotropic in-plane resistivity tensor, thereby revealing the crystal axes. The resistivity anisotropy ratio decreases linearly with increasing temperature T and carrier density reaching a maximum ratio of 3.0 at low temperatures and densities, while mobility indicates impurity scattering at low T and acoustic phonon scattering at high T.
AB - The crystal orientation of an exfoliated black phosphorous flake is determined by purely electrical means. A sequence of three resistance measurements on an arbitrarily shaped flake with five contacts determines the three independent components of the anisotropic in-plane resistivity tensor, thereby revealing the crystal axes. The resistivity anisotropy ratio decreases linearly with increasing temperature T and carrier density reaching a maximum ratio of 3.0 at low temperatures and densities, while mobility indicates impurity scattering at low T and acoustic phonon scattering at high T.
UR - http://www.scopus.com/inward/record.url?scp=85042935365&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85042935365&partnerID=8YFLogxK
U2 - 10.1103/PhysRevLett.120.086801
DO - 10.1103/PhysRevLett.120.086801
M3 - Article
AN - SCOPUS:85042935365
VL - 120
JO - Physical Review Letters
JF - Physical Review Letters
SN - 0031-9007
IS - 8
M1 - 086801
ER -