Analysis of the fluoride effect on the phase-selective growth of TlBa2Ca2Cu3O9-x thin films

Phase evolution and microstructure development

Richard J. McNeely, John A. Belot, Tobin J Marks, Yanguo Wang, Vinayak P. Dravid, Michael P. Chudzik, Carl R. Kannewurf

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Phase-selective growth of TlBa2Ca2Cu3O9-x films is greatly enhanced by annealing chemical vapor deposition derived BaCaCuO(F) precursor films in the presence of TlF. Nucleation of superconducting phases (≥840 °C under O2) progresses in the order 2212 → 2223 → 1212 → 1223. Annealing at 855 °C results in well-defined platelet grains, a significant number of which are a-axis oriented. Residual fluoride is not detectable at any stage of the annealing process. Thin films synthesized by TlF annealing differ markedly from films processed in the presence of Tl2O3 with Tc = 103 K and Jc > 105 A/cm2 (5 K, 4.5 T).

Original languageEnglish
Pages (from-to)1083-1097
Number of pages15
JournalJournal of Materials Research
Volume15
Issue number5
Publication statusPublished - May 2000

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Fluorides
fluorides
Annealing
Thin films
microstructure
Microstructure
annealing
thin films
Platelets
platelets
Chemical vapor deposition
Nucleation
vapor deposition
nucleation

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Analysis of the fluoride effect on the phase-selective growth of TlBa2Ca2Cu3O9-x thin films : Phase evolution and microstructure development. / McNeely, Richard J.; Belot, John A.; Marks, Tobin J; Wang, Yanguo; Dravid, Vinayak P.; Chudzik, Michael P.; Kannewurf, Carl R.

In: Journal of Materials Research, Vol. 15, No. 5, 05.2000, p. 1083-1097.

Research output: Contribution to journalArticle

McNeely, Richard J. ; Belot, John A. ; Marks, Tobin J ; Wang, Yanguo ; Dravid, Vinayak P. ; Chudzik, Michael P. ; Kannewurf, Carl R. / Analysis of the fluoride effect on the phase-selective growth of TlBa2Ca2Cu3O9-x thin films : Phase evolution and microstructure development. In: Journal of Materials Research. 2000 ; Vol. 15, No. 5. pp. 1083-1097.
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