Atomic force microscopy and X-ray photoelectron spectroscopy investigation of the onset of reactions on alkali silicate glass surfaces

Gregory I. Rudd, Steve Garofalini, David A. Hensley, C. Mathew Mate

Research output: Contribution to journalArticle

19 Citations (Scopus)

Abstract

Atomic force microscopy was used to measure forces acting on a sharp tungsten tip as it was brought into contact with silica and 30 mol% binary alkali silicate glasses. Experiments were performed in controlled atmospheres and under vacuum. Attractive forces and liquid-layer thicknesses were found to vary markedly between the glasses, and heterogeneity was observed on the binary alkali silicates analyzed in vacuo. Air or wet carbon dioxide exposure resulted in the penetration of the tip into a soft surface layer on the alkali silicates. In addition, liquid layer formation on the alkali silicates was found to be promoted by exposure to water vapor in the order lithium-4 torr (1 torr = 1.33×102 Pa) water. Surface segregation and leaching of potassium occurred under the same conditions.

Original languageEnglish
Pages (from-to)2555-2560
Number of pages6
JournalJournal of the American Ceramic Society
Volume76
Issue number10
Publication statusPublished - Oct 1993

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Silicates
Alkalies
Atomic force microscopy
X ray photoelectron spectroscopy
Glass
Surface segregation
Tungsten
Steam
Liquids
Lithium
Carbon Dioxide
Silicon Dioxide
Water vapor
Leaching
Potassium
Carbon dioxide
Silica
Vacuum
Protective atmospheres
Water

ASJC Scopus subject areas

  • Ceramics and Composites

Cite this

Atomic force microscopy and X-ray photoelectron spectroscopy investigation of the onset of reactions on alkali silicate glass surfaces. / Rudd, Gregory I.; Garofalini, Steve; Hensley, David A.; Mate, C. Mathew.

In: Journal of the American Ceramic Society, Vol. 76, No. 10, 10.1993, p. 2555-2560.

Research output: Contribution to journalArticle

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