TY - GEN
T1 - Atomic force photovoltaic microscopy
AU - Leever, Benjamin J.
AU - Pingree, Liam S.C.
AU - Hains, Alexander W.
AU - Irwin, Michael D.
AU - Marks, Tobin J.
AU - Hersam, Mark C.
PY - 2007/12/28
Y1 - 2007/12/28
N2 - A new conductive atomic force microscopy (AFM) technique, called atomic force photovoltaic microscopy, has been developed to characterize localized variations in the performance of organic photovoltaic devices. The technique works by illuminating microscopic solar cells with either broadband or narrowband light sources while injecting them with current through a conductive AFM probe. Sample biases ranging from -20V to +15 V have been applied in combination with simple lamps, lasers, and solar simulated light to generate current ranging from <1 pA to nearly 1 μ A. Simultaneous topographic and current maps are generated, and IV characteristics (including key figures of merit such as power conversion efficiency) can be determined for single cells. Preliminary data including evidence of localized variations in open circuit voltage are presented.
AB - A new conductive atomic force microscopy (AFM) technique, called atomic force photovoltaic microscopy, has been developed to characterize localized variations in the performance of organic photovoltaic devices. The technique works by illuminating microscopic solar cells with either broadband or narrowband light sources while injecting them with current through a conductive AFM probe. Sample biases ranging from -20V to +15 V have been applied in combination with simple lamps, lasers, and solar simulated light to generate current ranging from <1 pA to nearly 1 μ A. Simultaneous topographic and current maps are generated, and IV characteristics (including key figures of merit such as power conversion efficiency) can be determined for single cells. Preliminary data including evidence of localized variations in open circuit voltage are presented.
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M3 - Conference contribution
AN - SCOPUS:37349083855
SN - 084127438X
SN - 9780841274389
T3 - ACS National Meeting Book of Abstracts
BT - 233rd ACS National Meeting, Abstracts of Scientific Papers
T2 - 233rd ACS National Meeting
Y2 - 25 March 2007 through 29 March 2007
ER -