Atomic force photovoltaic microscopy

Benjamin J. Leever; Liam S.C. Pingree; Alexander W. Hains; Michael D. Irwin; Tobin J. Marks; Mark C. Hersam

Atomic force photovoltaic microscopy

Benjamin J. Leever, Liam S.C. Pingree, Alexander W. Hains, Michael D. Irwin, Tobin J. Marks, Mark C. Hersam

Northwestern University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A new conductive atomic force microscopy (AFM) technique, called atomic force photovoltaic microscopy, has been developed to characterize localized variations in the performance of organic photovoltaic devices. The technique works by illuminating microscopic solar cells with either broadband or narrowband light sources while injecting them with current through a conductive AFM probe. Sample biases ranging from -20V to +15 V have been applied in combination with simple lamps, lasers, and solar simulated light to generate current ranging from <1 pA to nearly 1 μ A. Simultaneous topographic and current maps are generated, and IV characteristics (including key figures of merit such as power conversion efficiency) can be determined for single cells. Preliminary data including evidence of localized variations in open circuit voltage are presented.

Original language	English
Title of host publication	233rd ACS National Meeting, Abstracts of Scientific Papers
Publication status	Published - Dec 28 2007
Event	233rd ACS National Meeting - Chicago, IL, United States Duration: Mar 25 2007 → Mar 29 2007

Publication series

Name	ACS National Meeting Book of Abstracts
ISSN (Print)	0065-7727

Other

Other	233rd ACS National Meeting
Country	United States
City	Chicago, IL
Period	3/25/07 → 3/29/07

ASJC Scopus subject areas

Chemistry(all)
Chemical Engineering(all)

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Cite this

Leever, B. J., Pingree, L. S. C., Hains, A. W., Irwin, M. D., Marks, T. J., & Hersam, M. C. (2007). Atomic force photovoltaic microscopy. In 233rd ACS National Meeting, Abstracts of Scientific Papers (ACS National Meeting Book of Abstracts).

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title = "Atomic force photovoltaic microscopy",

abstract = "A new conductive atomic force microscopy (AFM) technique, called atomic force photovoltaic microscopy, has been developed to characterize localized variations in the performance of organic photovoltaic devices. The technique works by illuminating microscopic solar cells with either broadband or narrowband light sources while injecting them with current through a conductive AFM probe. Sample biases ranging from -20V to +15 V have been applied in combination with simple lamps, lasers, and solar simulated light to generate current ranging from <1 pA to nearly 1 μ A. Simultaneous topographic and current maps are generated, and IV characteristics (including key figures of merit such as power conversion efficiency) can be determined for single cells. Preliminary data including evidence of localized variations in open circuit voltage are presented.",

author = "Leever, {Benjamin J.} and Pingree, {Liam S.C.} and Hains, {Alexander W.} and Irwin, {Michael D.} and Marks, {Tobin J.} and Hersam, {Mark C.}",

year = "2007",

month = dec,

day = "28",

language = "English",

isbn = "084127438X",

series = "ACS National Meeting Book of Abstracts",

booktitle = "233rd ACS National Meeting, Abstracts of Scientific Papers",

note = "233rd ACS National Meeting ; Conference date: 25-03-2007 Through 29-03-2007",

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T1 - Atomic force photovoltaic microscopy

AU - Leever, Benjamin J.

AU - Pingree, Liam S.C.

AU - Hains, Alexander W.

AU - Irwin, Michael D.

AU - Marks, Tobin J.

AU - Hersam, Mark C.

PY - 2007/12/28

Y1 - 2007/12/28

N2 - A new conductive atomic force microscopy (AFM) technique, called atomic force photovoltaic microscopy, has been developed to characterize localized variations in the performance of organic photovoltaic devices. The technique works by illuminating microscopic solar cells with either broadband or narrowband light sources while injecting them with current through a conductive AFM probe. Sample biases ranging from -20V to +15 V have been applied in combination with simple lamps, lasers, and solar simulated light to generate current ranging from <1 pA to nearly 1 μ A. Simultaneous topographic and current maps are generated, and IV characteristics (including key figures of merit such as power conversion efficiency) can be determined for single cells. Preliminary data including evidence of localized variations in open circuit voltage are presented.

AB - A new conductive atomic force microscopy (AFM) technique, called atomic force photovoltaic microscopy, has been developed to characterize localized variations in the performance of organic photovoltaic devices. The technique works by illuminating microscopic solar cells with either broadband or narrowband light sources while injecting them with current through a conductive AFM probe. Sample biases ranging from -20V to +15 V have been applied in combination with simple lamps, lasers, and solar simulated light to generate current ranging from <1 pA to nearly 1 μ A. Simultaneous topographic and current maps are generated, and IV characteristics (including key figures of merit such as power conversion efficiency) can be determined for single cells. Preliminary data including evidence of localized variations in open circuit voltage are presented.

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