Atomic force photovoltaic microscopy

Benjamin J. Leever, Liam S C Pingree, Alexander W. Hains, Michael D. Irwin, Tobin J Marks, Mark C Hersam

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A new conductive atomic force microscopy (AFM) technique, called atomic force photovoltaic microscopy, has been developed to characterize localized variations in the performance of organic photovoltaic devices. The technique works by illuminating microscopic solar cells with either broadband or narrowband light sources while injecting them with current through a conductive AFM probe. Sample biases ranging from -20V to +15 V have been applied in combination with simple lamps, lasers, and solar simulated light to generate current ranging from

Original languageEnglish
Title of host publicationACS National Meeting Book of Abstracts
Publication statusPublished - 2007
Event233rd ACS National Meeting - Chicago, IL, United States
Duration: Mar 25 2007Mar 29 2007

Other

Other233rd ACS National Meeting
CountryUnited States
CityChicago, IL
Period3/25/073/29/07

Fingerprint

Atomic force microscopy
Microscopic examination
Electric lamps
Light sources
Solar cells
Lasers

ASJC Scopus subject areas

  • Chemistry(all)

Cite this

Leever, B. J., Pingree, L. S. C., Hains, A. W., Irwin, M. D., Marks, T. J., & Hersam, M. C. (2007). Atomic force photovoltaic microscopy. In ACS National Meeting Book of Abstracts

Atomic force photovoltaic microscopy. / Leever, Benjamin J.; Pingree, Liam S C; Hains, Alexander W.; Irwin, Michael D.; Marks, Tobin J; Hersam, Mark C.

ACS National Meeting Book of Abstracts. 2007.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Leever, BJ, Pingree, LSC, Hains, AW, Irwin, MD, Marks, TJ & Hersam, MC 2007, Atomic force photovoltaic microscopy. in ACS National Meeting Book of Abstracts. 233rd ACS National Meeting, Chicago, IL, United States, 3/25/07.
Leever BJ, Pingree LSC, Hains AW, Irwin MD, Marks TJ, Hersam MC. Atomic force photovoltaic microscopy. In ACS National Meeting Book of Abstracts. 2007
Leever, Benjamin J. ; Pingree, Liam S C ; Hains, Alexander W. ; Irwin, Michael D. ; Marks, Tobin J ; Hersam, Mark C. / Atomic force photovoltaic microscopy. ACS National Meeting Book of Abstracts. 2007.
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