Abstract
A new conductive atomic force microscopy (AFM) technique, called atomic force photovoltaic microscopy, has been developed to characterize localized variations in the performance of organic photovoltaic devices. The technique works by illuminating microscopic solar cells with either broadband or narrowband light sources while injecting them with current through a conductive AFM probe. Sample biases ranging from -20V to +15 V have been applied in combination with simple lamps, lasers, and solar simulated light to generate current ranging from
| Original language | English |
|---|---|
| Title of host publication | ACS National Meeting Book of Abstracts |
| Publication status | Published - 2007 |
| Event | 233rd ACS National Meeting - Chicago, IL, United States Duration: Mar 25 2007 → Mar 29 2007 |
Other
| Other | 233rd ACS National Meeting |
|---|---|
| Country | United States |
| City | Chicago, IL |
| Period | 3/25/07 → 3/29/07 |
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ASJC Scopus subject areas
- Chemistry(all)
Cite this
Atomic force photovoltaic microscopy. / Leever, Benjamin J.; Pingree, Liam S C; Hains, Alexander W.; Irwin, Michael D.; Marks, Tobin J; Hersam, Mark C.
ACS National Meeting Book of Abstracts. 2007.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Atomic force photovoltaic microscopy
AU - Leever, Benjamin J.
AU - Pingree, Liam S C
AU - Hains, Alexander W.
AU - Irwin, Michael D.
AU - Marks, Tobin J
AU - Hersam, Mark C
PY - 2007
Y1 - 2007
N2 - A new conductive atomic force microscopy (AFM) technique, called atomic force photovoltaic microscopy, has been developed to characterize localized variations in the performance of organic photovoltaic devices. The technique works by illuminating microscopic solar cells with either broadband or narrowband light sources while injecting them with current through a conductive AFM probe. Sample biases ranging from -20V to +15 V have been applied in combination with simple lamps, lasers, and solar simulated light to generate current ranging from
AB - A new conductive atomic force microscopy (AFM) technique, called atomic force photovoltaic microscopy, has been developed to characterize localized variations in the performance of organic photovoltaic devices. The technique works by illuminating microscopic solar cells with either broadband or narrowband light sources while injecting them with current through a conductive AFM probe. Sample biases ranging from -20V to +15 V have been applied in combination with simple lamps, lasers, and solar simulated light to generate current ranging from
UR - http://www.scopus.com/inward/record.url?scp=37349083855&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=37349083855&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:37349083855
SN - 084127438X
SN - 9780841274389
BT - ACS National Meeting Book of Abstracts
ER -