Abstract
The use of the backscattering/channeling surface peak in surface structure analysis is described. A compilation of surface peak intensity measurements is given and shown to be in good agreement withcalculations. Studies in three areas of surface science are discussed: (1) hydrogen induced ordering of reconstructed surfaces; (2) the structure of reordered Si surface (3) investigations of the first stage of Au/Ag(111) epitaxy.
Original language | English |
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Pages (from-to) | 211-219 |
Number of pages | 9 |
Journal | Nuclear Instruments and Methods |
Volume | 191 |
Issue number | 1-3 |
DOIs | |
Publication status | Published - Dec 31 1981 |
ASJC Scopus subject areas
- Engineering(all)