Atomic positions of surface atoms using high energy ion scattering

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Abstract

The use of the backscattering/channeling surface peak in surface structure analysis is described. A compilation of surface peak intensity measurements is given and shown to be in good agreement withcalculations. Studies in three areas of surface science are discussed: (1) hydrogen induced ordering of reconstructed surfaces; (2) the structure of reordered Si surface (3) investigations of the first stage of Au/Ag(111) epitaxy.

Original languageEnglish
Pages (from-to)211-219
Number of pages9
JournalNuclear Instruments and Methods
Volume191
Issue number1-3
DOIs
Publication statusPublished - Dec 31 1981

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ASJC Scopus subject areas

  • Engineering(all)

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