Atomic-scale roughness effect on capillary force in atomic force microscopy

Research output: Contribution to journalArticle

44 Citations (Scopus)

Abstract

We study the capillary force in atomic force microscopy by using Monte Carlo simulations. Adopting a lattice gas model for water, we simulated water menisci that form between a rough silicon-nitride tip and a mica surface. Unlike its macroscopic counterpart, the water meniscus at the nanoscale gives rise to a capillary force that responds sensitively to the tip roughness. With only a slight change in tip shape, the pull-off force significantly changes its qualitative variation with humidity.

Original languageEnglish
Pages (from-to)659-662
Number of pages4
JournalJournal of Physical Chemistry B
Volume110
Issue number2
DOIs
Publication statusPublished - Jan 19 2006

Fingerprint

Atomic force microscopy
roughness
Surface roughness
menisci
atomic force microscopy
Water
water
Mica
mica
Silicon nitride
silicon nitrides
humidity
Atmospheric humidity
Gases
gases
simulation
Monte Carlo simulation
silicon nitride

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry

Cite this

Atomic-scale roughness effect on capillary force in atomic force microscopy. / Jang, Joonkyung; Ratner, Mark A; Schatz, George C.

In: Journal of Physical Chemistry B, Vol. 110, No. 2, 19.01.2006, p. 659-662.

Research output: Contribution to journalArticle

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