Abstract
Molecular dynamics simulations of approximately 15 Å thick intergranular films (IGFs) containing SiO2 and CaO in contact with two surface terminations of the prism (10̄ 10) and basal planes (0001) of Si3N4 were performed using a multibody interatomic potential. Samples with the same composition (1.5 mol% CaO) and number of atoms but different crystal planes (i.e., the prism and basal planes of Si3N4) were studied. In both the prism and basal cases, the IGF in the final configuration is well-ordered in the interface region. A small number of N ions from the crystal moved into the IGF near the interface, and O ions moved into the N sites in the crystal, indicating the formation of a Si-O-N interface. In addition, Ca ions do not segregate to the IGF-crystal interface. The bonding characteristics of the O ions at the interface with neighbor Si ions are different in the prism and basal cases. Such difference may be explained by the difference in the two crystal Si3N4 surfaces. The Si-O bond length of the IGF has a range from 1.62 Å to 1.64 Å, consistent with recent experimental findings.
| Original language | English |
|---|---|
| Pages (from-to) | 752-758 |
| Number of pages | 7 |
| Journal | Journal of Materials Research |
| Volume | 19 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 2004 |
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Keywords
- Computer simulation
- Glass
- Grain boundaries
ASJC Scopus subject areas
- Materials Science(all)
- Mechanical Engineering
- Mechanics of Materials
- Condensed Matter Physics
Cite this
Atomistic structure of calcium silicate intergranular films between prism and Basal planes in silicon nitride : A molecular dynamics study. / Su, Xiaotao; Garofalini, Steve.
In: Journal of Materials Research, Vol. 19, No. 3, 2004, p. 752-758.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Atomistic structure of calcium silicate intergranular films between prism and Basal planes in silicon nitride
T2 - A molecular dynamics study
AU - Su, Xiaotao
AU - Garofalini, Steve
PY - 2004
Y1 - 2004
N2 - Molecular dynamics simulations of approximately 15 Å thick intergranular films (IGFs) containing SiO2 and CaO in contact with two surface terminations of the prism (10̄ 10) and basal planes (0001) of Si3N4 were performed using a multibody interatomic potential. Samples with the same composition (1.5 mol% CaO) and number of atoms but different crystal planes (i.e., the prism and basal planes of Si3N4) were studied. In both the prism and basal cases, the IGF in the final configuration is well-ordered in the interface region. A small number of N ions from the crystal moved into the IGF near the interface, and O ions moved into the N sites in the crystal, indicating the formation of a Si-O-N interface. In addition, Ca ions do not segregate to the IGF-crystal interface. The bonding characteristics of the O ions at the interface with neighbor Si ions are different in the prism and basal cases. Such difference may be explained by the difference in the two crystal Si3N4 surfaces. The Si-O bond length of the IGF has a range from 1.62 Å to 1.64 Å, consistent with recent experimental findings.
AB - Molecular dynamics simulations of approximately 15 Å thick intergranular films (IGFs) containing SiO2 and CaO in contact with two surface terminations of the prism (10̄ 10) and basal planes (0001) of Si3N4 were performed using a multibody interatomic potential. Samples with the same composition (1.5 mol% CaO) and number of atoms but different crystal planes (i.e., the prism and basal planes of Si3N4) were studied. In both the prism and basal cases, the IGF in the final configuration is well-ordered in the interface region. A small number of N ions from the crystal moved into the IGF near the interface, and O ions moved into the N sites in the crystal, indicating the formation of a Si-O-N interface. In addition, Ca ions do not segregate to the IGF-crystal interface. The bonding characteristics of the O ions at the interface with neighbor Si ions are different in the prism and basal cases. Such difference may be explained by the difference in the two crystal Si3N4 surfaces. The Si-O bond length of the IGF has a range from 1.62 Å to 1.64 Å, consistent with recent experimental findings.
KW - Computer simulation
KW - Glass
KW - Grain boundaries
UR - http://www.scopus.com/inward/record.url?scp=1942487411&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=1942487411&partnerID=8YFLogxK
U2 - 10.1557/jmr.2004.19.3.752
DO - 10.1557/jmr.2004.19.3.752
M3 - Article
AN - SCOPUS:1942487411
VL - 19
SP - 752
EP - 758
JO - Journal of Materials Research
JF - Journal of Materials Research
SN - 0884-2914
IS - 3
ER -