Auger electron emission induced by MeV H+ and He+ ions

Jack R. Macdonald, L. C. Feldman, P. J. Silverman, J. A. Davies, K. Griffiths, T. E. Jackman, P. R. Norton, W. N. Unertl

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Abstract

The detection of Auger electrons under MeV ion bombardment has been investigated as a surface analytical probe of particular utility for low- and middle-Z elements. Using UHV chambers at Bell Laboratories and Chalk River, we have observed Auger electron emission with cylindrical mirror analyzers operated in both the energy-integral and energy-differential modes. Single crystal targets of Si, Ni and Au were bombarded with H+ and 4He+ beams in the 1-2 MeV range under channeled and random directions of incidence. A large reduction in Auger yield occurs under channeling conditions and the observed channeled-to-random ratio, YCA YR A, correlates well with a simple model based on the shadow cone radius, the lattice vibrational amplitude, the adiabatic electron excitation distance and the Auger electron escape length. An even stronger channeling effect isseen in the total electron yield. This is attributed to the enhancement of YR by inelastically scattered electrons of higher energy, originating deep within the target.

Original languageEnglish
Pages (from-to)765-770
Number of pages6
JournalNuclear Instruments and Methods In Physics Research
Volume218
Issue number1-3
DOIs
Publication statusPublished - Dec 15 1983

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ASJC Scopus subject areas

  • Engineering(all)

Cite this

Macdonald, J. R., Feldman, L. C., Silverman, P. J., Davies, J. A., Griffiths, K., Jackman, T. E., Norton, P. R., & Unertl, W. N. (1983). Auger electron emission induced by MeV H+ and He+ ions. Nuclear Instruments and Methods In Physics Research, 218(1-3), 765-770. https://doi.org/10.1016/0167-5087(83)91079-7