Barrier heights at the SnO2/Pt interface

In situ photoemission and electrical properties

Christoph Körber, Steven P. Harvey, Thomas O Mason, Andreas Klein

Research output: Contribution to journalArticle

46 Citations (Scopus)

Abstract

The SnO2/Pt contact has been investigated using in situ photoelectron spectroscopy and electrical 2-point and 4-point conductivity measurements. A remarkable increase of barrier height from 0.4 eV to 0.9 eV is observed after annealing the as-deposited contact in 0.5 Pa oxygen atmosphere. Subsequent annealing in vacuum reduces the barrier height again. Despite the expected large barrier height, the current-voltage characteristics displays ohmic behavior. The discrepancy between photoemission and electrical behavior is attributed to the polycrystalline nature of the SnO2 film used in this study, leading to an inhomogeneous Schottky barrier height along the surface of polycrystalline specimens.

Original languageEnglish
Pages (from-to)3246-3252
Number of pages7
JournalSurface Science
Volume602
Issue number21
DOIs
Publication statusPublished - Nov 1 2008

Fingerprint

Photoemission
Electric properties
photoelectric emission
electrical properties
Annealing
Current voltage characteristics
Photoelectron spectroscopy
Vacuum
Oxygen
annealing
photoelectron spectroscopy
atmospheres
conductivity
vacuum
electric potential
oxygen

Keywords

  • Electrical transport measurement
  • Photoelectron spectroscopy
  • Platinum
  • Schottky barrier
  • Tin oxide

ASJC Scopus subject areas

  • Surfaces and Interfaces
  • Condensed Matter Physics
  • Materials Chemistry
  • Surfaces, Coatings and Films

Cite this

Barrier heights at the SnO2/Pt interface : In situ photoemission and electrical properties. / Körber, Christoph; Harvey, Steven P.; Mason, Thomas O; Klein, Andreas.

In: Surface Science, Vol. 602, No. 21, 01.11.2008, p. 3246-3252.

Research output: Contribution to journalArticle

Körber, Christoph ; Harvey, Steven P. ; Mason, Thomas O ; Klein, Andreas. / Barrier heights at the SnO2/Pt interface : In situ photoemission and electrical properties. In: Surface Science. 2008 ; Vol. 602, No. 21. pp. 3246-3252.
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