Brick layer model analysis of nanoscale-to-microscale cerium dioxide

Jin Ha Hwang, D. S. Mclachlan, Thomas O Mason

Research output: Contribution to journalArticle

81 Citations (Scopus)

Abstract

The frequency-dependent impedance/dielectric behavior of the brick-layer model (BLM) was investigated vs. grain size and local parameters (resistivity, dielectric constant, and grain boundary width). The simulation shows a maximum in capacitance vs. grain size, governed by the grain boundary-to-grain interior resistivity ratio. The BLM was employed to analyze the 500 °C impedance behavior of polycrystalline cerium dioxide from the nano- (approximately 15 nm grain size) to the micro- (approximately 4 μm grain size) regime. The grain boundary resistivity is orders of magnitude larger than that of the grain interiors in the microcystalline specimen. This contrast is significantly smaller in the nanocrystalline specimens, suggesting enhanced conduction at grain boundaries. The limitations of the BLM for simulating the behavior of complex electroceramic microstructures are discussed.

Original languageEnglish
Pages (from-to)7-16
Number of pages10
JournalJournal of Electroceramics
Volume3
Issue number1
DOIs
Publication statusPublished - 1999

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bricks
Cerium
Brick
cerium
dioxides
microbalances
Grain boundaries
grain boundaries
grain size
electrical resistivity
impedance
Permittivity
Capacitance
capacitance
permittivity
conduction
microstructure
Microstructure
ceric oxide
simulation

ASJC Scopus subject areas

  • Ceramics and Composites

Cite this

Brick layer model analysis of nanoscale-to-microscale cerium dioxide. / Hwang, Jin Ha; Mclachlan, D. S.; Mason, Thomas O.

In: Journal of Electroceramics, Vol. 3, No. 1, 1999, p. 7-16.

Research output: Contribution to journalArticle

Hwang, Jin Ha ; Mclachlan, D. S. ; Mason, Thomas O. / Brick layer model analysis of nanoscale-to-microscale cerium dioxide. In: Journal of Electroceramics. 1999 ; Vol. 3, No. 1. pp. 7-16.
@article{198b0d57443d41dd8cfcb58af7d869db,
title = "Brick layer model analysis of nanoscale-to-microscale cerium dioxide",
abstract = "The frequency-dependent impedance/dielectric behavior of the brick-layer model (BLM) was investigated vs. grain size and local parameters (resistivity, dielectric constant, and grain boundary width). The simulation shows a maximum in capacitance vs. grain size, governed by the grain boundary-to-grain interior resistivity ratio. The BLM was employed to analyze the 500 °C impedance behavior of polycrystalline cerium dioxide from the nano- (approximately 15 nm grain size) to the micro- (approximately 4 μm grain size) regime. The grain boundary resistivity is orders of magnitude larger than that of the grain interiors in the microcystalline specimen. This contrast is significantly smaller in the nanocrystalline specimens, suggesting enhanced conduction at grain boundaries. The limitations of the BLM for simulating the behavior of complex electroceramic microstructures are discussed.",
author = "Hwang, {Jin Ha} and Mclachlan, {D. S.} and Mason, {Thomas O}",
year = "1999",
doi = "10.1023/A:1009998114205",
language = "English",
volume = "3",
pages = "7--16",
journal = "Journal of Electroceramics",
issn = "1385-3449",
publisher = "Springer Netherlands",
number = "1",

}

TY - JOUR

T1 - Brick layer model analysis of nanoscale-to-microscale cerium dioxide

AU - Hwang, Jin Ha

AU - Mclachlan, D. S.

AU - Mason, Thomas O

PY - 1999

Y1 - 1999

N2 - The frequency-dependent impedance/dielectric behavior of the brick-layer model (BLM) was investigated vs. grain size and local parameters (resistivity, dielectric constant, and grain boundary width). The simulation shows a maximum in capacitance vs. grain size, governed by the grain boundary-to-grain interior resistivity ratio. The BLM was employed to analyze the 500 °C impedance behavior of polycrystalline cerium dioxide from the nano- (approximately 15 nm grain size) to the micro- (approximately 4 μm grain size) regime. The grain boundary resistivity is orders of magnitude larger than that of the grain interiors in the microcystalline specimen. This contrast is significantly smaller in the nanocrystalline specimens, suggesting enhanced conduction at grain boundaries. The limitations of the BLM for simulating the behavior of complex electroceramic microstructures are discussed.

AB - The frequency-dependent impedance/dielectric behavior of the brick-layer model (BLM) was investigated vs. grain size and local parameters (resistivity, dielectric constant, and grain boundary width). The simulation shows a maximum in capacitance vs. grain size, governed by the grain boundary-to-grain interior resistivity ratio. The BLM was employed to analyze the 500 °C impedance behavior of polycrystalline cerium dioxide from the nano- (approximately 15 nm grain size) to the micro- (approximately 4 μm grain size) regime. The grain boundary resistivity is orders of magnitude larger than that of the grain interiors in the microcystalline specimen. This contrast is significantly smaller in the nanocrystalline specimens, suggesting enhanced conduction at grain boundaries. The limitations of the BLM for simulating the behavior of complex electroceramic microstructures are discussed.

UR - http://www.scopus.com/inward/record.url?scp=0032684662&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032684662&partnerID=8YFLogxK

U2 - 10.1023/A:1009998114205

DO - 10.1023/A:1009998114205

M3 - Article

VL - 3

SP - 7

EP - 16

JO - Journal of Electroceramics

JF - Journal of Electroceramics

SN - 1385-3449

IS - 1

ER -