Bridge-enhanced nanoscale impedance microscopy

L. S C Pingree, Mark C Hersam

Research output: Contribution to journalArticle

28 Citations (Scopus)

Abstract

A conductive atomic force microscopy (cAFM) technique has been developed that is capable of quantitatively measuring the magnitude and phase of alternating current flow through the tip/sample junction with a five order of magnitude improvement in sensitivity. Bridge-enhanced nanoscale impedance microscopy (BE-NIM) uses a tunable resistor/capacitor bridge circuit to null the spurious contribution to the tip/sample current caused by fringe capacitance between the cAFM cantilever and the sample. As a proof of principle, BE-NIM is used to characterize an array of electron-beam lithographically patterned metal-oxide-semiconductor capacitors and compared directly to conventional nanoscale impedance microscopy. In addition, BE-NIM is applied to a multiwalled carbon nanotube/poly (m -phenylenevinylene-co-2,5-dioctyloxy-p- phenylenevinylene) nanocomposite material, on which the alternating current behavior of individual nanoscale conductive pathways is quantitatively probed.

Original languageEnglish
Article number233117
Pages (from-to)1-3
Number of pages3
JournalApplied Physics Letters
Volume87
Issue number23
DOIs
Publication statusPublished - 2005

Fingerprint

impedance
microscopy
alternating current
capacitors
atomic force microscopy
metal oxide semiconductors
resistors
nanocomposites
capacitance
carbon nanotubes
electron beams
sensitivity

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Bridge-enhanced nanoscale impedance microscopy. / Pingree, L. S C; Hersam, Mark C.

In: Applied Physics Letters, Vol. 87, No. 23, 233117, 2005, p. 1-3.

Research output: Contribution to journalArticle

Pingree, L. S C ; Hersam, Mark C. / Bridge-enhanced nanoscale impedance microscopy. In: Applied Physics Letters. 2005 ; Vol. 87, No. 23. pp. 1-3.
@article{02f36c560bc64c3d88d47cf437509db2,
title = "Bridge-enhanced nanoscale impedance microscopy",
abstract = "A conductive atomic force microscopy (cAFM) technique has been developed that is capable of quantitatively measuring the magnitude and phase of alternating current flow through the tip/sample junction with a five order of magnitude improvement in sensitivity. Bridge-enhanced nanoscale impedance microscopy (BE-NIM) uses a tunable resistor/capacitor bridge circuit to null the spurious contribution to the tip/sample current caused by fringe capacitance between the cAFM cantilever and the sample. As a proof of principle, BE-NIM is used to characterize an array of electron-beam lithographically patterned metal-oxide-semiconductor capacitors and compared directly to conventional nanoscale impedance microscopy. In addition, BE-NIM is applied to a multiwalled carbon nanotube/poly (m -phenylenevinylene-co-2,5-dioctyloxy-p- phenylenevinylene) nanocomposite material, on which the alternating current behavior of individual nanoscale conductive pathways is quantitatively probed.",
author = "Pingree, {L. S C} and Hersam, {Mark C}",
year = "2005",
doi = "10.1063/1.2137874",
language = "English",
volume = "87",
pages = "1--3",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "23",

}

TY - JOUR

T1 - Bridge-enhanced nanoscale impedance microscopy

AU - Pingree, L. S C

AU - Hersam, Mark C

PY - 2005

Y1 - 2005

N2 - A conductive atomic force microscopy (cAFM) technique has been developed that is capable of quantitatively measuring the magnitude and phase of alternating current flow through the tip/sample junction with a five order of magnitude improvement in sensitivity. Bridge-enhanced nanoscale impedance microscopy (BE-NIM) uses a tunable resistor/capacitor bridge circuit to null the spurious contribution to the tip/sample current caused by fringe capacitance between the cAFM cantilever and the sample. As a proof of principle, BE-NIM is used to characterize an array of electron-beam lithographically patterned metal-oxide-semiconductor capacitors and compared directly to conventional nanoscale impedance microscopy. In addition, BE-NIM is applied to a multiwalled carbon nanotube/poly (m -phenylenevinylene-co-2,5-dioctyloxy-p- phenylenevinylene) nanocomposite material, on which the alternating current behavior of individual nanoscale conductive pathways is quantitatively probed.

AB - A conductive atomic force microscopy (cAFM) technique has been developed that is capable of quantitatively measuring the magnitude and phase of alternating current flow through the tip/sample junction with a five order of magnitude improvement in sensitivity. Bridge-enhanced nanoscale impedance microscopy (BE-NIM) uses a tunable resistor/capacitor bridge circuit to null the spurious contribution to the tip/sample current caused by fringe capacitance between the cAFM cantilever and the sample. As a proof of principle, BE-NIM is used to characterize an array of electron-beam lithographically patterned metal-oxide-semiconductor capacitors and compared directly to conventional nanoscale impedance microscopy. In addition, BE-NIM is applied to a multiwalled carbon nanotube/poly (m -phenylenevinylene-co-2,5-dioctyloxy-p- phenylenevinylene) nanocomposite material, on which the alternating current behavior of individual nanoscale conductive pathways is quantitatively probed.

UR - http://www.scopus.com/inward/record.url?scp=28444463240&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=28444463240&partnerID=8YFLogxK

U2 - 10.1063/1.2137874

DO - 10.1063/1.2137874

M3 - Article

AN - SCOPUS:28444463240

VL - 87

SP - 1

EP - 3

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 23

M1 - 233117

ER -