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Characterization and modeling of the nitrogen passivation of interface traps in SiO2/4H-SiC
K. McDonald, R. A. Weller, S. T. Pantelides, L. C. Feldman, G. Y. Chung, C. C. Tin, J. R. Williams
Research output: Contribution to journal › Article › peer-review
89
Citations
(Scopus)