Characterization of a monolayer graphitic structure

X. Lin, X. K. Wang, V. P. Dravid, J. B. Ketterson, Robert P. H. Chang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A new material of monolayer graphitic structure was characterized by electron diffraction, high resolution transmission electron microscopy and EELS. Results indicate that there is no (002) reflection in all orientations, meaning the graphite sheets are completely separated.

Original languageEnglish
Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
EditorsG.W. Bailey, A.J. Garratt-Reed
Pages760-761
Number of pages2
Publication statusPublished - 1994
EventProceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA
Duration: Jul 31 1994Aug 5 1994

Other

OtherProceedings of the 52nd Annual Meeting of the Microscopy Society of America
CityNew Orleans, LA, USA
Period7/31/948/5/94

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Lin, X., Wang, X. K., Dravid, V. P., Ketterson, J. B., & Chang, R. P. H. (1994). Characterization of a monolayer graphitic structure. In G. W. Bailey, & A. J. Garratt-Reed (Eds.), Proceedings - Annual Meeting, Microscopy Society of America (pp. 760-761)