Characterization of a monolayer graphitic structure

X. Lin; X. K. Wang; V. P. Dravid; J. B. Ketterson; Robert P. H. Chang

Characterization of a monolayer graphitic structure

X. Lin, X. K. Wang, V. P. Dravid, J. B. Ketterson, Robert P. H. Chang

Northwestern University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A new material of monolayer graphitic structure was characterized by electron diffraction, high resolution transmission electron microscopy and EELS. Results indicate that there is no (002) reflection in all orientations, meaning the graphite sheets are completely separated.

Original language	English
Title of host publication	Proceedings - Annual Meeting, Microscopy Society of America
Editors	G.W. Bailey, A.J. Garratt-Reed
Pages	760-761
Number of pages	2
Publication status	Published - 1994
Event	Proceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA Duration: Jul 31 1994 → Aug 5 1994

Other

Other	Proceedings of the 52nd Annual Meeting of the Microscopy Society of America
City	New Orleans, LA, USA
Period	7/31/94 → 8/5/94

ASJC Scopus subject areas

Engineering(all)

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@inproceedings{8e40112348b9434da0b0daed913167d6,

title = "Characterization of a monolayer graphitic structure",

abstract = "A new material of monolayer graphitic structure was characterized by electron diffraction, high resolution transmission electron microscopy and EELS. Results indicate that there is no (002) reflection in all orientations, meaning the graphite sheets are completely separated.",

author = "X. Lin and Wang, {X. K.} and Dravid, {V. P.} and Ketterson, {J. B.} and Chang, {Robert P. H.}",

year = "1994",

language = "English",

pages = "760--761",

editor = "G.W. Bailey and A.J. Garratt-Reed",

booktitle = "Proceedings - Annual Meeting, Microscopy Society of America",

note = "Proceedings of the 52nd Annual Meeting of the Microscopy Society of America ; Conference date: 31-07-1994 Through 05-08-1994",

}

TY - GEN

T1 - Characterization of a monolayer graphitic structure

AU - Lin, X.

AU - Wang, X. K.

AU - Dravid, V. P.

AU - Ketterson, J. B.

AU - Chang, Robert P. H.

PY - 1994

Y1 - 1994

N2 - A new material of monolayer graphitic structure was characterized by electron diffraction, high resolution transmission electron microscopy and EELS. Results indicate that there is no (002) reflection in all orientations, meaning the graphite sheets are completely separated.

AB - A new material of monolayer graphitic structure was characterized by electron diffraction, high resolution transmission electron microscopy and EELS. Results indicate that there is no (002) reflection in all orientations, meaning the graphite sheets are completely separated.

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UR - http://www.scopus.com/inward/citedby.url?scp=0028746402&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0028746402

SP - 760

EP - 761

BT - Proceedings - Annual Meeting, Microscopy Society of America

A2 - Bailey, G.W.

A2 - Garratt-Reed, A.J.

T2 - Proceedings of the 52nd Annual Meeting of the Microscopy Society of America

Y2 - 31 July 1994 through 5 August 1994

ER -