Characterization of Electronic Transport through Amorphous TiO2 Produced by Atomic Layer Deposition

Paul Nunez, Matthias H. Richter, Brandon D. Piercy, Christopher W. Roske, Miguel Cabán-Acevedo, Mark D. Losego, Steven J. Konezny, David J. Fermin, Shu Hu, Bruce S. Brunschwig, Nathan S. Lewis

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Engineering & Materials Science

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