Characterization of new materials in a four-sample thermoelectric measurement system

N. A. Ghelani, S. Y. Loo, D. Y. Chung, S. Sportouch, S. De Nardi, Mercouri G Kanatzidis, T. P. Hogan, G. S. Nolas

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Several new materials in the CsBi4Te6, A2Bi8Se13, (A = K, Rb, Cs), HoNiSb, Ba/Ge/B (B = In, Sn), and AgPbBiQ3 (Q = S, Se, Te) systems have shown promising characteristics for thermoelectric applications. New synthesis techniques are able to produce samples at much higher rates than previously possible. This has led to a persistent challenge in thermoelectric materials research of rapid and comprehensive characterization of samples. This paper presents a description of a new 4-sample transport measurement system and the related measurement techniques. Special features of the system include fully computer-controlled operation (implemented in Lab ViewTM) for simultaneous measurement of electrical conductivity, thermo-electric power, and thermal conductivity. This system has been successfully used to characterize several new thermoelectric materials (including some of the above-mentioned compounds) and reference materials exhibiting a wide range of thermal conductivities.

Original languageEnglish
Title of host publicationProceedings - IEEE International Symposium on Circuits and Systems
Volume4
Publication statusPublished - 2001
EventIEEE International Symposium on Circuits and Systems (ISCAS 2001) - Sydney, NSW, Australia
Duration: May 6 2001May 9 2001

Other

OtherIEEE International Symposium on Circuits and Systems (ISCAS 2001)
CountryAustralia
CitySydney, NSW
Period5/6/015/9/01

Fingerprint

Thermal conductivity
Thermoelectric power
Electric Conductivity

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Ghelani, N. A., Loo, S. Y., Chung, D. Y., Sportouch, S., De Nardi, S., Kanatzidis, M. G., ... Nolas, G. S. (2001). Characterization of new materials in a four-sample thermoelectric measurement system. In Proceedings - IEEE International Symposium on Circuits and Systems (Vol. 4)

Characterization of new materials in a four-sample thermoelectric measurement system. / Ghelani, N. A.; Loo, S. Y.; Chung, D. Y.; Sportouch, S.; De Nardi, S.; Kanatzidis, Mercouri G; Hogan, T. P.; Nolas, G. S.

Proceedings - IEEE International Symposium on Circuits and Systems. Vol. 4 2001.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ghelani, NA, Loo, SY, Chung, DY, Sportouch, S, De Nardi, S, Kanatzidis, MG, Hogan, TP & Nolas, GS 2001, Characterization of new materials in a four-sample thermoelectric measurement system. in Proceedings - IEEE International Symposium on Circuits and Systems. vol. 4, IEEE International Symposium on Circuits and Systems (ISCAS 2001), Sydney, NSW, Australia, 5/6/01.
Ghelani NA, Loo SY, Chung DY, Sportouch S, De Nardi S, Kanatzidis MG et al. Characterization of new materials in a four-sample thermoelectric measurement system. In Proceedings - IEEE International Symposium on Circuits and Systems. Vol. 4. 2001
Ghelani, N. A. ; Loo, S. Y. ; Chung, D. Y. ; Sportouch, S. ; De Nardi, S. ; Kanatzidis, Mercouri G ; Hogan, T. P. ; Nolas, G. S. / Characterization of new materials in a four-sample thermoelectric measurement system. Proceedings - IEEE International Symposium on Circuits and Systems. Vol. 4 2001.
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AU - Kanatzidis, Mercouri G

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