Characterization of PbTe-based thermoelectric materials by scanning/ transmission electron microscopy (S/TEM)

J. He, S. Girard, J. R. Sootsman, Mercouri G Kanatzidis, V. P. Dravid

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)1400-1401
Number of pages2
JournalMicroscopy and Microanalysis
Volume15
Issue numberSUPPL. 2
DOIs
Publication statusPublished - Jul 2009

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thermoelectric materials
Transmission electron microscopy
transmission electron microscopy
Scanning electron microscopy
scanning electron microscopy

ASJC Scopus subject areas

  • Instrumentation

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Characterization of PbTe-based thermoelectric materials by scanning/ transmission electron microscopy (S/TEM). / He, J.; Girard, S.; Sootsman, J. R.; Kanatzidis, Mercouri G; Dravid, V. P.

In: Microscopy and Microanalysis, Vol. 15, No. SUPPL. 2, 07.2009, p. 1400-1401.

Research output: Contribution to journalArticle

He, J. ; Girard, S. ; Sootsman, J. R. ; Kanatzidis, Mercouri G ; Dravid, V. P. / Characterization of PbTe-based thermoelectric materials by scanning/ transmission electron microscopy (S/TEM). In: Microscopy and Microanalysis. 2009 ; Vol. 15, No. SUPPL. 2. pp. 1400-1401.
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