TY - GEN
T1 - Characterization of silicon-based molecular resonant tunneling diodes with scanning tunneling microscopy
AU - Guisinger, N. P.
AU - Basu, R.
AU - Greene, M. E.
AU - Baluch, A. S.
AU - Hersam, M. C.
PY - 2004/12/1
Y1 - 2004/12/1
N2 - The silicon-based molecular resonant tunneling diodes were characterized using scanning tunneling microscopy (STM). The STM current-voltage characteristics on individual molecules mounted on degenerately n-type Si(100) showed multiple negative differential resistance (NDR) events at negative sample bias. When the Si(100) substrate bias is changed to degenerate p-type doping, multiple NDR events were observed at positive sample bias, while the discontinuities in the differential conductance occurred at negative sample bias. The results suggested that this effect can be attributed to the broadening of molecular energy levels through intermolecular interactions or concurrent tunneling paths through multiple molecules.
AB - The silicon-based molecular resonant tunneling diodes were characterized using scanning tunneling microscopy (STM). The STM current-voltage characteristics on individual molecules mounted on degenerately n-type Si(100) showed multiple negative differential resistance (NDR) events at negative sample bias. When the Si(100) substrate bias is changed to degenerate p-type doping, multiple NDR events were observed at positive sample bias, while the discontinuities in the differential conductance occurred at negative sample bias. The results suggested that this effect can be attributed to the broadening of molecular energy levels through intermolecular interactions or concurrent tunneling paths through multiple molecules.
UR - http://www.scopus.com/inward/record.url?scp=18044385158&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=18044385158&partnerID=8YFLogxK
U2 - 10.1109/DRC.2004.1367861
DO - 10.1109/DRC.2004.1367861
M3 - Conference contribution
AN - SCOPUS:18044385158
SN - 0780382846
T3 - Device Research Conference - Conference Digest, DRC
SP - 195
EP - 197
BT - Device Research Conference - Conference Digest, 62nd DRC
T2 - Device Research Conference - Conference Digest, 62nd DRC
Y2 - 21 June 2004 through 23 June 2004
ER -