Characterization of the electrical properties of individual p-Si microwire/polymer/n-Si microwire assemblies

Iman Yahyaie, Kevin McEleney, Michael G. Walter, Derek R. Oliver, Douglas J. Thomson, Michael S. Freund, Nathan S. Lewis

Research output: Contribution to journalArticlepeer-review

15 Citations (Scopus)


The electrical properties of individual p- and n-type silicon microwires have been investigated using a direct contact formation technique, in which an Ohmic contact between the tungsten probe and microwire was produced by applying mechanical force to the probe/microwire junction. This method alleviated the need for lithography or a high-temperature process to form a metal/Si ohmic contact. The technique was also used to characterize the Si microwire/conducting polymer junctions in a single cell of a membrane-supported bilayer Si microwire structure that is of interest for the direct production of fuels from sunlight. The data indicate that the combination of PEDOT-PSS-Nafion and highly doped Si microwires is suitable, from an electrical resistance perspective, to be used in a solar fuels generation device.

Original languageEnglish
Pages (from-to)24945-24950
Number of pages6
JournalJournal of Physical Chemistry C
Issue number50
Publication statusPublished - Dec 22 2011

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Energy(all)
  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films

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