Characterization of the electrical properties of individual p-Si microwire/polymer/n-Si microwire assemblies

Iman Yahyaie; Kevin McEleney; Michael G. Walter; Derek R. Oliver; Douglas J. Thomson; Michael S. Freund; Nathan S. Lewis

doi:10.1021/jp2088719

Characterization of the electrical properties of individual p-Si microwire/polymer/n-Si microwire assemblies

Iman Yahyaie, Kevin McEleney, Michael G. Walter, Derek R. Oliver, Douglas J. Thomson, Michael S. Freund, Nathan S. Lewis

California Institute of Technology

Research output: Contribution to journal › Article › peer-review

15 Citations (Scopus)

Abstract

The electrical properties of individual p- and n-type silicon microwires have been investigated using a direct contact formation technique, in which an Ohmic contact between the tungsten probe and microwire was produced by applying mechanical force to the probe/microwire junction. This method alleviated the need for lithography or a high-temperature process to form a metal/Si ohmic contact. The technique was also used to characterize the Si microwire/conducting polymer junctions in a single cell of a membrane-supported bilayer Si microwire structure that is of interest for the direct production of fuels from sunlight. The data indicate that the combination of PEDOT-PSS-Nafion and highly doped Si microwires is suitable, from an electrical resistance perspective, to be used in a solar fuels generation device.

Original language	English
Pages (from-to)	24945-24950
Number of pages	6
Journal	Journal of Physical Chemistry C
Volume	115
Issue number	50
DOIs	https://doi.org/10.1021/jp2088719
Publication status	Published - Dec 22 2011

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Energy(all)
Physical and Theoretical Chemistry
Surfaces, Coatings and Films

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10.1021/jp2088719

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Characterization of the electrical properties of individual p-Si microwire/polymer/n-Si microwire assemblies. / Yahyaie, Iman; McEleney, Kevin; Walter, Michael G.; Oliver, Derek R.; Thomson, Douglas J.; Freund, Michael S.; Lewis, Nathan S.

In: Journal of Physical Chemistry C, Vol. 115, No. 50, 22.12.2011, p. 24945-24950.

Research output: Contribution to journal › Article › peer-review

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abstract = "The electrical properties of individual p- and n-type silicon microwires have been investigated using a direct contact formation technique, in which an Ohmic contact between the tungsten probe and microwire was produced by applying mechanical force to the probe/microwire junction. This method alleviated the need for lithography or a high-temperature process to form a metal/Si ohmic contact. The technique was also used to characterize the Si microwire/conducting polymer junctions in a single cell of a membrane-supported bilayer Si microwire structure that is of interest for the direct production of fuels from sunlight. The data indicate that the combination of PEDOT-PSS-Nafion and highly doped Si microwires is suitable, from an electrical resistance perspective, to be used in a solar fuels generation device.",

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AU - Thomson, Douglas J.

AU - Freund, Michael S.

AU - Lewis, Nathan S.

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