Charge injection into disordered molecular films

Alexander L. Burin, Mark A Ratner

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

Light-emitting devices made by organic or inorganic dielectric films placed between two metal electrodes emit light because of the radiative recombination of positive and negative charge carriers entering the dielectric from the anode and cathode sides, respectively, under applied voltage. Standard vapor-deposition technology of the device construction suggests the remarkable disordering at the metal dielectric interface and in the structure of dielectric film. The structural imperfections strongly affect carrier injection and transport, device efficiency, performance, and stability. In this article we describe the effect of disordering on the injection current through the dielectric layer and discuss the implications for the device performance.

Original languageEnglish
Pages (from-to)2601-2621
Number of pages21
JournalJournal of Polymer Science, Part B: Polymer Physics
Volume41
Issue number21
DOIs
Publication statusPublished - Nov 1 2003

Fingerprint

Charge injection
Dielectric films
injection
Metals
Vapor deposition
Charge carriers
Anodes
Cathodes
carrier injection
radiative recombination
Defects
Electrodes
metals
Electric potential
charge carriers
anodes
cathodes
vapor deposition
electrodes
defects

Keywords

  • Amorphous
  • Disorder
  • Injection
  • Interfaces
  • Light-emitting diodes (LED)

ASJC Scopus subject areas

  • Polymers and Plastics
  • Materials Chemistry

Cite this

Charge injection into disordered molecular films. / Burin, Alexander L.; Ratner, Mark A.

In: Journal of Polymer Science, Part B: Polymer Physics, Vol. 41, No. 21, 01.11.2003, p. 2601-2621.

Research output: Contribution to journalArticle

@article{3885456ad83d47c8b6cf626781fc902e,
title = "Charge injection into disordered molecular films",
abstract = "Light-emitting devices made by organic or inorganic dielectric films placed between two metal electrodes emit light because of the radiative recombination of positive and negative charge carriers entering the dielectric from the anode and cathode sides, respectively, under applied voltage. Standard vapor-deposition technology of the device construction suggests the remarkable disordering at the metal dielectric interface and in the structure of dielectric film. The structural imperfections strongly affect carrier injection and transport, device efficiency, performance, and stability. In this article we describe the effect of disordering on the injection current through the dielectric layer and discuss the implications for the device performance.",
keywords = "Amorphous, Disorder, Injection, Interfaces, Light-emitting diodes (LED)",
author = "Burin, {Alexander L.} and Ratner, {Mark A}",
year = "2003",
month = "11",
day = "1",
doi = "10.1002/polb.10651",
language = "English",
volume = "41",
pages = "2601--2621",
journal = "Journal of Polymer Science, Part B: Polymer Physics",
issn = "0887-6266",
publisher = "John Wiley and Sons Inc.",
number = "21",

}

TY - JOUR

T1 - Charge injection into disordered molecular films

AU - Burin, Alexander L.

AU - Ratner, Mark A

PY - 2003/11/1

Y1 - 2003/11/1

N2 - Light-emitting devices made by organic or inorganic dielectric films placed between two metal electrodes emit light because of the radiative recombination of positive and negative charge carriers entering the dielectric from the anode and cathode sides, respectively, under applied voltage. Standard vapor-deposition technology of the device construction suggests the remarkable disordering at the metal dielectric interface and in the structure of dielectric film. The structural imperfections strongly affect carrier injection and transport, device efficiency, performance, and stability. In this article we describe the effect of disordering on the injection current through the dielectric layer and discuss the implications for the device performance.

AB - Light-emitting devices made by organic or inorganic dielectric films placed between two metal electrodes emit light because of the radiative recombination of positive and negative charge carriers entering the dielectric from the anode and cathode sides, respectively, under applied voltage. Standard vapor-deposition technology of the device construction suggests the remarkable disordering at the metal dielectric interface and in the structure of dielectric film. The structural imperfections strongly affect carrier injection and transport, device efficiency, performance, and stability. In this article we describe the effect of disordering on the injection current through the dielectric layer and discuss the implications for the device performance.

KW - Amorphous

KW - Disorder

KW - Injection

KW - Interfaces

KW - Light-emitting diodes (LED)

UR - http://www.scopus.com/inward/record.url?scp=0242386367&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0242386367&partnerID=8YFLogxK

U2 - 10.1002/polb.10651

DO - 10.1002/polb.10651

M3 - Article

AN - SCOPUS:0242386367

VL - 41

SP - 2601

EP - 2621

JO - Journal of Polymer Science, Part B: Polymer Physics

JF - Journal of Polymer Science, Part B: Polymer Physics

SN - 0887-6266

IS - 21

ER -