Chemically resolved interface structure of epitaxial graphene on SiC(0001)

Jonathan D. Emery, Blanka Detlefs, Hunter J. Karmel, Luke O. Nyakiti, D. Kurt Gaskill, Mark C. Hersam, Jörg Zegenhagen, Michael J. Bedzyk

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Abstract

Atomic-layer 2D crystals have unique properties that can be significantly modified through interaction with an underlying support. For epitaxial graphene on SiC(0001), the interface strongly influences the electronic properties of the overlaying graphene. We demonstrate a novel combination of x-ray scattering and spectroscopy for studying the complexities of such a buried interface structure. This approach employs x-ray standing wave-excited photoelectron spectroscopy in conjunction with x-ray reflectivity to produce a highly resolved chemically sensitive atomic profile for the terminal substrate bilayers, interface, and graphene layers along the SiC[0001] direction.

Original languageEnglish
Article number215501
JournalPhysical review letters
Volume111
Issue number21
DOIs
Publication statusPublished - Nov 19 2013

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ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Emery, J. D., Detlefs, B., Karmel, H. J., Nyakiti, L. O., Gaskill, D. K., Hersam, M. C., Zegenhagen, J., & Bedzyk, M. J. (2013). Chemically resolved interface structure of epitaxial graphene on SiC(0001). Physical review letters, 111(21), [215501]. https://doi.org/10.1103/PhysRevLett.111.215501