Chemistry and electronics of single layer MoS2 domains from photoelectron spectromicroscopy using laboratory excitation sources

M. Frégnaux, H. Kim, D. Rouchon, V. Derycke, J. Bleuse, D. Voiry, Manish Chhowalla, O. Renault

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

In the recent context of emerging two-dimensional (2D) materials, a comprehensive set of spatially resolved photoelectron spectroscopic techniques providing information ranging from surface chemical states to electronic band structure must be available at the practical level (i.e. from laboratory-based instrumentation) for a better understanding of their outstanding properties. We highlight recent capabilities of X-ray PhotoElectron Emission Microscopy (XPEEM) and reciprocal-space VUV-PEEM (kPEEM) for addressing this issue, with a report on microscopic analyses of chemical vapor deposited (CVD) molybdenum disulfide (MoS2) domains. These include band structure imaging with event-counting detection allowing to perform angle-resolved ultra-violet photoelectron spectroscopy (ARUPS) in a parallel way with energy resolution of 200meV and less, and k resolution of 0.05Å-1. Copyright

Original languageEnglish
JournalSurface and Interface Analysis
DOIs
Publication statusAccepted/In press - 2016

Fingerprint

Photoelectrons
Band structure
photoelectrons
Electronic equipment
chemistry
molybdenum disulfides
Photoelectron spectroscopy
Ultraviolet spectroscopy
electronics
Molybdenum
excitation
emerging
Microscopic examination
counting
Vapors
photoelectron spectroscopy
vapors
microscopy
Imaging techniques
X rays

Keywords

  • 2D materials
  • Electronic band structure
  • Transition metal dichalcogenides
  • Work function
  • XPEEM

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Materials Chemistry
  • Surfaces, Coatings and Films

Cite this

Chemistry and electronics of single layer MoS2 domains from photoelectron spectromicroscopy using laboratory excitation sources. / Frégnaux, M.; Kim, H.; Rouchon, D.; Derycke, V.; Bleuse, J.; Voiry, D.; Chhowalla, Manish; Renault, O.

In: Surface and Interface Analysis, 2016.

Research output: Contribution to journalArticle

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