Combined electron diffraction/microanalysis investigation of crystallography and cation distributions in the transparent conductive oxide Cd1+xIn2-2xSnxO4

L. N. Brewer, D. R. Kammler, Thomas O Mason, V. P. Dravid

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

The distribution of Cd, In, and Sn cations on the spinel lattice was investigated across the solid solution, Cd1+xIn2-2xSHxO4. Convergent beam electron diffraction was used to establish the presence of the spinel crystallography throughout the solid solution. Atom location by channeling enhanced microanalysis was employed to determine the distributions of cations on the octahedral and tetrahedral lattice sites. CdIn2O4 was observed to be a normal-type spinel. As x was increased, the cation distribution became more random as Cd and Sn filled the octahedral sublattice. These observations may correlate with previously observed changes in optical gap and conductivity across the solution.

Original languageEnglish
Pages (from-to)951-954
Number of pages4
JournalJournal of Applied Physics
Volume89
Issue number2
DOIs
Publication statusPublished - Jan 15 2001

Fingerprint

microanalysis
crystallography
spinel
electron diffraction
cations
oxides
solid solutions
sublattices
conductivity
atoms

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Physics and Astronomy (miscellaneous)

Cite this

Combined electron diffraction/microanalysis investigation of crystallography and cation distributions in the transparent conductive oxide Cd1+xIn2-2xSnxO4 . / Brewer, L. N.; Kammler, D. R.; Mason, Thomas O; Dravid, V. P.

In: Journal of Applied Physics, Vol. 89, No. 2, 15.01.2001, p. 951-954.

Research output: Contribution to journalArticle

@article{36de8486886a4373a3b259a74bccc660,
title = "Combined electron diffraction/microanalysis investigation of crystallography and cation distributions in the transparent conductive oxide Cd1+xIn2-2xSnxO4",
abstract = "The distribution of Cd, In, and Sn cations on the spinel lattice was investigated across the solid solution, Cd1+xIn2-2xSHxO4. Convergent beam electron diffraction was used to establish the presence of the spinel crystallography throughout the solid solution. Atom location by channeling enhanced microanalysis was employed to determine the distributions of cations on the octahedral and tetrahedral lattice sites. CdIn2O4 was observed to be a normal-type spinel. As x was increased, the cation distribution became more random as Cd and Sn filled the octahedral sublattice. These observations may correlate with previously observed changes in optical gap and conductivity across the solution.",
author = "Brewer, {L. N.} and Kammler, {D. R.} and Mason, {Thomas O} and Dravid, {V. P.}",
year = "2001",
month = "1",
day = "15",
doi = "10.1063/1.1340736",
language = "English",
volume = "89",
pages = "951--954",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "2",

}

TY - JOUR

T1 - Combined electron diffraction/microanalysis investigation of crystallography and cation distributions in the transparent conductive oxide Cd1+xIn2-2xSnxO4

AU - Brewer, L. N.

AU - Kammler, D. R.

AU - Mason, Thomas O

AU - Dravid, V. P.

PY - 2001/1/15

Y1 - 2001/1/15

N2 - The distribution of Cd, In, and Sn cations on the spinel lattice was investigated across the solid solution, Cd1+xIn2-2xSHxO4. Convergent beam electron diffraction was used to establish the presence of the spinel crystallography throughout the solid solution. Atom location by channeling enhanced microanalysis was employed to determine the distributions of cations on the octahedral and tetrahedral lattice sites. CdIn2O4 was observed to be a normal-type spinel. As x was increased, the cation distribution became more random as Cd and Sn filled the octahedral sublattice. These observations may correlate with previously observed changes in optical gap and conductivity across the solution.

AB - The distribution of Cd, In, and Sn cations on the spinel lattice was investigated across the solid solution, Cd1+xIn2-2xSHxO4. Convergent beam electron diffraction was used to establish the presence of the spinel crystallography throughout the solid solution. Atom location by channeling enhanced microanalysis was employed to determine the distributions of cations on the octahedral and tetrahedral lattice sites. CdIn2O4 was observed to be a normal-type spinel. As x was increased, the cation distribution became more random as Cd and Sn filled the octahedral sublattice. These observations may correlate with previously observed changes in optical gap and conductivity across the solution.

UR - http://www.scopus.com/inward/record.url?scp=0000112455&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0000112455&partnerID=8YFLogxK

U2 - 10.1063/1.1340736

DO - 10.1063/1.1340736

M3 - Article

VL - 89

SP - 951

EP - 954

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 2

ER -