Combined Jonker and Ioffe analysis of oxide conductors and semiconductors

Qimin Zhu, E. Mitchell Hopper, Brian J. Ingram, Thomas O Mason

Research output: Contribution to journalArticle

25 Citations (Scopus)

Abstract

Jonker plots (Seebeck coefficient versus logarithm of conductivity) have been utilized to obtain the product of the density of states (DOS) and mobility (μ) in oxide semiconductors, from which the maximum electrical conductivity can be estimated for degenerate transparent conducting oxide (TCO) applications. In addition, the DOS-μ product can be utilized to predict the maximum achievable "power factor" (PF, Seebeck coefficient squared times conductivity) for oxide semiconductors. The PF is an important parameter governing the figure of merit for thermoelectric oxide (TEO) applications. The procedure employs an analysis developed by Ioffe, and provides an important screening tool for oxide (and other) thermoelectric materials, based upon data from polycrystalline ceramic specimens. Several oxides, including known transparent conductors, are considered as TCO and TEO case studies in the present work.

Original languageEnglish
Pages (from-to)187-193
Number of pages7
JournalJournal of the American Ceramic Society
Volume94
Issue number1
DOIs
Publication statusPublished - Jan 2011

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Oxides
Semiconductor materials
Seebeck coefficient
Screening
Oxide semiconductors

ASJC Scopus subject areas

  • Ceramics and Composites
  • Materials Chemistry

Cite this

Combined Jonker and Ioffe analysis of oxide conductors and semiconductors. / Zhu, Qimin; Hopper, E. Mitchell; Ingram, Brian J.; Mason, Thomas O.

In: Journal of the American Ceramic Society, Vol. 94, No. 1, 01.2011, p. 187-193.

Research output: Contribution to journalArticle

Zhu, Qimin ; Hopper, E. Mitchell ; Ingram, Brian J. ; Mason, Thomas O. / Combined Jonker and Ioffe analysis of oxide conductors and semiconductors. In: Journal of the American Ceramic Society. 2011 ; Vol. 94, No. 1. pp. 187-193.
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