Combined Jonker and Ioffe analysis of oxide conductors and semiconductors

Qimin Zhu; E. Mitchell Hopper; Brian J. Ingram; Thomas O. Mason

doi:10.1111/j.1551-2916.2010.04047.x

Combined Jonker and Ioffe analysis of oxide conductors and semiconductors

Qimin Zhu, E. Mitchell Hopper, Brian J. Ingram, Thomas O. Mason

Northwestern University

Research output: Contribution to journal › Article

29 Citations (Scopus)

Abstract

Jonker plots (Seebeck coefficient versus logarithm of conductivity) have been utilized to obtain the product of the density of states (DOS) and mobility (μ) in oxide semiconductors, from which the maximum electrical conductivity can be estimated for degenerate transparent conducting oxide (TCO) applications. In addition, the DOS-μ product can be utilized to predict the maximum achievable "power factor" (PF, Seebeck coefficient squared times conductivity) for oxide semiconductors. The PF is an important parameter governing the figure of merit for thermoelectric oxide (TEO) applications. The procedure employs an analysis developed by Ioffe, and provides an important screening tool for oxide (and other) thermoelectric materials, based upon data from polycrystalline ceramic specimens. Several oxides, including known transparent conductors, are considered as TCO and TEO case studies in the present work.

Original language	English
Pages (from-to)	187-193
Number of pages	7
Journal	Journal of the American Ceramic Society
Volume	94
Issue number	1
DOIs	https://doi.org/10.1111/j.1551-2916.2010.04047.x
Publication status	Published - Jan 1 2011

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ASJC Scopus subject areas

Ceramics and Composites
Materials Chemistry

Cite this

Zhu, Q., Hopper, E. M., Ingram, B. J., & Mason, T. O. (2011). Combined Jonker and Ioffe analysis of oxide conductors and semiconductors. Journal of the American Ceramic Society, 94(1), 187-193. https://doi.org/10.1111/j.1551-2916.2010.04047.x

@article{ced01749b3e9468c8aec7be81f428a0a,

title = "Combined Jonker and Ioffe analysis of oxide conductors and semiconductors",

abstract = "Jonker plots (Seebeck coefficient versus logarithm of conductivity) have been utilized to obtain the product of the density of states (DOS) and mobility (μ) in oxide semiconductors, from which the maximum electrical conductivity can be estimated for degenerate transparent conducting oxide (TCO) applications. In addition, the DOS-μ product can be utilized to predict the maximum achievable {"}power factor{"} (PF, Seebeck coefficient squared times conductivity) for oxide semiconductors. The PF is an important parameter governing the figure of merit for thermoelectric oxide (TEO) applications. The procedure employs an analysis developed by Ioffe, and provides an important screening tool for oxide (and other) thermoelectric materials, based upon data from polycrystalline ceramic specimens. Several oxides, including known transparent conductors, are considered as TCO and TEO case studies in the present work.",

author = "Qimin Zhu and Hopper, {E. Mitchell} and Ingram, {Brian J.} and Mason, {Thomas O.}",

year = "2011",

month = jan

day = "1",

doi = "10.1111/j.1551-2916.2010.04047.x",

language = "English",

volume = "94",

pages = "187--193",

journal = "Journal of the American Ceramic Society",

issn = "0002-7820",

publisher = "Wiley-Blackwell",

number = "1",

}

TY - JOUR

T1 - Combined Jonker and Ioffe analysis of oxide conductors and semiconductors

AU - Zhu, Qimin

AU - Hopper, E. Mitchell

AU - Ingram, Brian J.

AU - Mason, Thomas O.

PY - 2011/1/1

Y1 - 2011/1/1

N2 - Jonker plots (Seebeck coefficient versus logarithm of conductivity) have been utilized to obtain the product of the density of states (DOS) and mobility (μ) in oxide semiconductors, from which the maximum electrical conductivity can be estimated for degenerate transparent conducting oxide (TCO) applications. In addition, the DOS-μ product can be utilized to predict the maximum achievable "power factor" (PF, Seebeck coefficient squared times conductivity) for oxide semiconductors. The PF is an important parameter governing the figure of merit for thermoelectric oxide (TEO) applications. The procedure employs an analysis developed by Ioffe, and provides an important screening tool for oxide (and other) thermoelectric materials, based upon data from polycrystalline ceramic specimens. Several oxides, including known transparent conductors, are considered as TCO and TEO case studies in the present work.

AB - Jonker plots (Seebeck coefficient versus logarithm of conductivity) have been utilized to obtain the product of the density of states (DOS) and mobility (μ) in oxide semiconductors, from which the maximum electrical conductivity can be estimated for degenerate transparent conducting oxide (TCO) applications. In addition, the DOS-μ product can be utilized to predict the maximum achievable "power factor" (PF, Seebeck coefficient squared times conductivity) for oxide semiconductors. The PF is an important parameter governing the figure of merit for thermoelectric oxide (TEO) applications. The procedure employs an analysis developed by Ioffe, and provides an important screening tool for oxide (and other) thermoelectric materials, based upon data from polycrystalline ceramic specimens. Several oxides, including known transparent conductors, are considered as TCO and TEO case studies in the present work.

UR - http://www.scopus.com/inward/record.url?scp=80053129007&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=80053129007&partnerID=8YFLogxK

U2 - 10.1111/j.1551-2916.2010.04047.x

DO - 10.1111/j.1551-2916.2010.04047.x

M3 - Article

AN - SCOPUS:80053129007

VL - 94

SP - 187

EP - 193

JO - Journal of the American Ceramic Society

JF - Journal of the American Ceramic Society

SN - 0002-7820

IS - 1

ER -

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10.1111/j.1551-2916.2010.04047.x