Abstract
Jonker plots (Seebeck coefficient versus logarithm of conductivity) have been utilized to obtain the product of the density of states (DOS) and mobility (μ) in oxide semiconductors, from which the maximum electrical conductivity can be estimated for degenerate transparent conducting oxide (TCO) applications. In addition, the DOS-μ product can be utilized to predict the maximum achievable "power factor" (PF, Seebeck coefficient squared times conductivity) for oxide semiconductors. The PF is an important parameter governing the figure of merit for thermoelectric oxide (TEO) applications. The procedure employs an analysis developed by Ioffe, and provides an important screening tool for oxide (and other) thermoelectric materials, based upon data from polycrystalline ceramic specimens. Several oxides, including known transparent conductors, are considered as TCO and TEO case studies in the present work.
| Original language | English |
|---|---|
| Pages (from-to) | 187-193 |
| Number of pages | 7 |
| Journal | Journal of the American Ceramic Society |
| Volume | 94 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - Jan 2011 |
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ASJC Scopus subject areas
- Ceramics and Composites
- Materials Chemistry
Cite this
Combined Jonker and Ioffe analysis of oxide conductors and semiconductors. / Zhu, Qimin; Hopper, E. Mitchell; Ingram, Brian J.; Mason, Thomas O.
In: Journal of the American Ceramic Society, Vol. 94, No. 1, 01.2011, p. 187-193.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Combined Jonker and Ioffe analysis of oxide conductors and semiconductors
AU - Zhu, Qimin
AU - Hopper, E. Mitchell
AU - Ingram, Brian J.
AU - Mason, Thomas O
PY - 2011/1
Y1 - 2011/1
N2 - Jonker plots (Seebeck coefficient versus logarithm of conductivity) have been utilized to obtain the product of the density of states (DOS) and mobility (μ) in oxide semiconductors, from which the maximum electrical conductivity can be estimated for degenerate transparent conducting oxide (TCO) applications. In addition, the DOS-μ product can be utilized to predict the maximum achievable "power factor" (PF, Seebeck coefficient squared times conductivity) for oxide semiconductors. The PF is an important parameter governing the figure of merit for thermoelectric oxide (TEO) applications. The procedure employs an analysis developed by Ioffe, and provides an important screening tool for oxide (and other) thermoelectric materials, based upon data from polycrystalline ceramic specimens. Several oxides, including known transparent conductors, are considered as TCO and TEO case studies in the present work.
AB - Jonker plots (Seebeck coefficient versus logarithm of conductivity) have been utilized to obtain the product of the density of states (DOS) and mobility (μ) in oxide semiconductors, from which the maximum electrical conductivity can be estimated for degenerate transparent conducting oxide (TCO) applications. In addition, the DOS-μ product can be utilized to predict the maximum achievable "power factor" (PF, Seebeck coefficient squared times conductivity) for oxide semiconductors. The PF is an important parameter governing the figure of merit for thermoelectric oxide (TEO) applications. The procedure employs an analysis developed by Ioffe, and provides an important screening tool for oxide (and other) thermoelectric materials, based upon data from polycrystalline ceramic specimens. Several oxides, including known transparent conductors, are considered as TCO and TEO case studies in the present work.
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UR - http://www.scopus.com/inward/citedby.url?scp=80053129007&partnerID=8YFLogxK
U2 - 10.1111/j.1551-2916.2010.04047.x
DO - 10.1111/j.1551-2916.2010.04047.x
M3 - Article
AN - SCOPUS:80053129007
VL - 94
SP - 187
EP - 193
JO - Journal of the American Ceramic Society
JF - Journal of the American Ceramic Society
SN - 0002-7820
IS - 1
ER -