Comprehensive characterization of copper indium disulfide thin film

R. Mu, D. O. Henderson, A. Ueda, M. H. Wu, J. A. Bennett, M. A M Paliza, M. B. Huang, J. Keay, Leonard C Feldman, K. C. Kwiatkowski, C. M. Lukehart, J. Hollingsworth, W. E. Buhro, J. Harris, E. Gordon, al et al

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Structural, optical and electrical characterization has been conducted on CuInS2 (CIS) thin film fabricated via spray CVD technique. Both RBS and Raman scattering analyses suggest that the film is slightly Cu rich by approx. 2%. XRD measurement indicates the film is polycrystalline CuInS2 with [220] orientation on a quartz substrate with a possible Cu1.7In0.05S secondary phase (

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages116-124
Number of pages9
Volume3789
Publication statusPublished - 1999
EventProceedings of the 1999 Solar Optical Materials XVI - Denver, CO, USA
Duration: Jul 22 1999Jul 22 1999

Other

OtherProceedings of the 1999 Solar Optical Materials XVI
CityDenver, CO, USA
Period7/22/997/22/99

Fingerprint

disulfides
Indium
indium
Copper
Thin films
copper
thin films
sprayers
Raman scattering
Quartz
Chemical vapor deposition
quartz
vapor deposition
Raman spectra
Substrates
scattering

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Mu, R., Henderson, D. O., Ueda, A., Wu, M. H., Bennett, J. A., Paliza, M. A. M., ... et al, A. (1999). Comprehensive characterization of copper indium disulfide thin film. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3789, pp. 116-124). Society of Photo-Optical Instrumentation Engineers.

Comprehensive characterization of copper indium disulfide thin film. / Mu, R.; Henderson, D. O.; Ueda, A.; Wu, M. H.; Bennett, J. A.; Paliza, M. A M; Huang, M. B.; Keay, J.; Feldman, Leonard C; Kwiatkowski, K. C.; Lukehart, C. M.; Hollingsworth, J.; Buhro, W. E.; Harris, J.; Gordon, E.; et al, al.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3789 Society of Photo-Optical Instrumentation Engineers, 1999. p. 116-124.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Mu, R, Henderson, DO, Ueda, A, Wu, MH, Bennett, JA, Paliza, MAM, Huang, MB, Keay, J, Feldman, LC, Kwiatkowski, KC, Lukehart, CM, Hollingsworth, J, Buhro, WE, Harris, J, Gordon, E & et al, A 1999, Comprehensive characterization of copper indium disulfide thin film. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 3789, Society of Photo-Optical Instrumentation Engineers, pp. 116-124, Proceedings of the 1999 Solar Optical Materials XVI, Denver, CO, USA, 7/22/99.
Mu R, Henderson DO, Ueda A, Wu MH, Bennett JA, Paliza MAM et al. Comprehensive characterization of copper indium disulfide thin film. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3789. Society of Photo-Optical Instrumentation Engineers. 1999. p. 116-124
Mu, R. ; Henderson, D. O. ; Ueda, A. ; Wu, M. H. ; Bennett, J. A. ; Paliza, M. A M ; Huang, M. B. ; Keay, J. ; Feldman, Leonard C ; Kwiatkowski, K. C. ; Lukehart, C. M. ; Hollingsworth, J. ; Buhro, W. E. ; Harris, J. ; Gordon, E. ; et al, al. / Comprehensive characterization of copper indium disulfide thin film. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3789 Society of Photo-Optical Instrumentation Engineers, 1999. pp. 116-124
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