Comprehensive characterization of copper indium disulfide thin film

R. Mu, D. O. Henderson, A. Ueda, M. H. Wu, J. A. Bennett, M. A.M. Paliza, M. B. Huang, J. Keay, L. C. Feldman, K. C. Kwiatkowski, C. M. Lukehart, J. Hollingsworth, W. E. Buhro, J. Harris, E. Gordon, al et al

Research output: Contribution to journalConference articlepeer-review

2 Citations (Scopus)

Fingerprint Dive into the research topics of 'Comprehensive characterization of copper indium disulfide thin film'. Together they form a unique fingerprint.

Chemical Compounds

Mathematics

Engineering & Materials Science

Physics & Astronomy