Consequences of anode interfacial layer deletion. HCl-treated ITO in P3HT: PCBM-based bulk-heterojunction organic photovoltaic devices

Michael D. Irwin, Jun Liu, Benjamin J. Leever, Jonathan D. Servaites, Mark C. Hersam, Michael F. Durstock, Tobin J. Marks

Research output: Contribution to journalArticle

36 Citations (Scopus)

Abstract

In studies to simplify the fabrication of bulk-heterojunction organic photovoltaic (OPV) devices, it was found that when glass/tin-doped indium oxide (ITO) substrates are treated with dilute aqueous HCl solutions, followed by UV ozone (UVO), and then used to fabricate devices of the structure glass/ITO/P3HT:PCBM/LiF/Al, device performance is greatly enhanced. Light-to-power conversion efficiency (Eff) increases from 2.4% for control devices in which the ITO surface is treated only with UVO to 3.8% with the HCl + UVO treatment-effectively matching the performance of an identical device having a PEDOT:PSS anode interfacial layer. The enhancement originates from increases in VOC from 463 to 554 mV and FF from 49% to 66%. The modified-ITO device also exhibits a 4× enhancement in thermal stability versus an identical device containing a PEDOT:PSS anode interfacial layer. To understand the origins of these effects, the ITO surface is analyzed as a function of treatment by ultraviolet photoelectron spectroscopy work function measurements, X-ray photoelectron spectroscopic composition analysis, and atomic force microscopic topography and conductivity imaging. Additionally, a diode-based device model is employed to further understand the effects of ITO surface treatment on device performance.

Original languageEnglish
Pages (from-to)2584-2591
Number of pages8
JournalLangmuir
Volume26
Issue number4
DOIs
Publication statusPublished - Feb 16 2010

Fingerprint

deletion
Ozone
ITO (semiconductors)
Heterojunctions
heterojunctions
Anodes
anodes
Ultraviolet photoelectron spectroscopy
ITO glass
Tin
Photoelectrons
ozone
Volatile organic compounds
Indium
Topography
Conversion efficiency
Surface treatment
Diodes
Thermodynamic stability
Imaging techniques

ASJC Scopus subject areas

  • Electrochemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Materials Science(all)
  • Spectroscopy

Cite this

Consequences of anode interfacial layer deletion. HCl-treated ITO in P3HT : PCBM-based bulk-heterojunction organic photovoltaic devices. / Irwin, Michael D.; Liu, Jun; Leever, Benjamin J.; Servaites, Jonathan D.; Hersam, Mark C.; Durstock, Michael F.; Marks, Tobin J.

In: Langmuir, Vol. 26, No. 4, 16.02.2010, p. 2584-2591.

Research output: Contribution to journalArticle

Irwin, Michael D. ; Liu, Jun ; Leever, Benjamin J. ; Servaites, Jonathan D. ; Hersam, Mark C. ; Durstock, Michael F. ; Marks, Tobin J. / Consequences of anode interfacial layer deletion. HCl-treated ITO in P3HT : PCBM-based bulk-heterojunction organic photovoltaic devices. In: Langmuir. 2010 ; Vol. 26, No. 4. pp. 2584-2591.
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