Contactless determination of electrical conductivity of one-dimensional nanomaterials by solution-based electro-orientation spectroscopy

Cevat Akin, Jingang Yi, Leonard C Feldman, Corentin Durand, Saban M. Hus, An Ping Li, Michael A. Filler, Jerry W. Shan

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

Nanowires of the same composition, and even fabricated within the same batch, often exhibit electrical conductivities that can vary by orders of magnitude. Unfortunately, existing electrical characterization methods are time-consuming, making the statistical survey of highly variable samples essentially impractical. Here, we demonstrate a contactless, solution-based method to efficiently measure the electrical conductivity of 1D nanomaterials based on their transient alignment behavior in ac electric fields of different frequencies. Comparison with direct transport measurements by probe-based scanning tunneling microscopy shows that electro-orientation spectroscopy can quantitatively measure nanowire conductivity over a 5-order-of-magnitude range, 10-5-1 Ω-1 m-1 (corresponding to resistivities in the range 102-107 Ω·cm). With this method, we statistically characterize the conductivity of a variety of nanowires and find significant variability in silicon nanowires grown by metal-assisted chemical etching from the same wafer. We also find that the active carrier concentration of n-type silicon nanowires is greatly reduced by surface traps and that surface passivation increases the effective conductivity by an order of magnitude. This simple method makes electrical characterization of insulating and semiconducting 1D nanomaterials far more efficient and accessible to more researchers than current approaches. Electro-orientation spectroscopy also has the potential to be integrated with other solution-based methods for the high-throughput sorting and manipulation of 1D nanomaterials for postgrowth device assembly.

Original languageEnglish
Pages (from-to)5405-5412
Number of pages8
JournalACS Nano
Volume9
Issue number5
DOIs
Publication statusPublished - May 26 2015

Fingerprint

Nanostructured materials
Nanowires
nanowires
Spectroscopy
electrical resistivity
spectroscopy
Silicon
conductivity
Scanning tunneling microscopy
silicon
classifying
Sorting
Passivation
passivity
Carrier concentration
scanning tunneling microscopy
manipulators
Etching
assembly
Metals

Keywords

  • electrical conductivity measurement
  • electro-orientation
  • nanotubes
  • nanowires
  • postgrowth sorting

ASJC Scopus subject areas

  • Engineering(all)
  • Materials Science(all)
  • Physics and Astronomy(all)

Cite this

Contactless determination of electrical conductivity of one-dimensional nanomaterials by solution-based electro-orientation spectroscopy. / Akin, Cevat; Yi, Jingang; Feldman, Leonard C; Durand, Corentin; Hus, Saban M.; Li, An Ping; Filler, Michael A.; Shan, Jerry W.

In: ACS Nano, Vol. 9, No. 5, 26.05.2015, p. 5405-5412.

Research output: Contribution to journalArticle

Akin, Cevat ; Yi, Jingang ; Feldman, Leonard C ; Durand, Corentin ; Hus, Saban M. ; Li, An Ping ; Filler, Michael A. ; Shan, Jerry W. / Contactless determination of electrical conductivity of one-dimensional nanomaterials by solution-based electro-orientation spectroscopy. In: ACS Nano. 2015 ; Vol. 9, No. 5. pp. 5405-5412.
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