Crystal growth and characterization of the X-ray and γ-ray detector material Cs 2Hg 6S 7

Hao Li, John A. Peters, Zhifu Liu, Maria Sebastian, Christos D. Malliakas, John Androulakis, Lidong Zhao, In Chung, Sandy L. Nguyen, Simon Johnsen, Bruce W. Wessels, Mercouri G Kanatzidis

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Abstract

Cs 2Hg 6S 7 is a promising compound for X-ray and γ-ray detection with a band gap of 1.63 eV. A new method is reported for the synthesis of Cs 2Hg 6S 7, along with growth studies of large Cs 2Hg 6S 7 crystals of dimensions up to several centimeters using the Bridgman method. Our growth technique gives reproducible crystals with high resistivity (10 6 ohm•cm). Crystals grown in this work exhibit figure of merit mobility lifetime (μτ) products comparable to commercial cadmium zinc telluride (CZT). The Cs 2Hg 6S 7 crystals exhibit a strong photoluminescence signal at low temperature in the range 1.50-1.75 eV. The thermal properties of the crystal, including the thermal expansion coefficient and the thermal conductivity, have been characterized. The nature of defects affecting the charge transport properties in the as-grown Cs 2Hg 6S 7 crystals is discussed. The noncentrosymmetric character of the tetragonal crystal structure (space group P4 2nm) gives rise to a nonlinear optical second harmonic generation response.

Original languageEnglish
Pages (from-to)3250-3256
Number of pages7
JournalCrystal Growth and Design
Volume12
Issue number6
DOIs
Publication statusPublished - Jun 6 2012

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Crystallization
Crystal growth
crystal growth
rays
Detectors
X rays
Crystals
detectors
crystals
x rays
zinc tellurides
Crystal growth from melt
cadmium tellurides
Bridgman method
Harmonic generation
figure of merit
Cadmium
Transport properties
Thermal expansion
Charge transfer

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Crystal growth and characterization of the X-ray and γ-ray detector material Cs 2Hg 6S 7 . / Li, Hao; Peters, John A.; Liu, Zhifu; Sebastian, Maria; Malliakas, Christos D.; Androulakis, John; Zhao, Lidong; Chung, In; Nguyen, Sandy L.; Johnsen, Simon; Wessels, Bruce W.; Kanatzidis, Mercouri G.

In: Crystal Growth and Design, Vol. 12, No. 6, 06.06.2012, p. 3250-3256.

Research output: Contribution to journalArticle

Li, H, Peters, JA, Liu, Z, Sebastian, M, Malliakas, CD, Androulakis, J, Zhao, L, Chung, I, Nguyen, SL, Johnsen, S, Wessels, BW & Kanatzidis, MG 2012, 'Crystal growth and characterization of the X-ray and γ-ray detector material Cs 2Hg 6S 7 ', Crystal Growth and Design, vol. 12, no. 6, pp. 3250-3256. https://doi.org/10.1021/cg300385s
Li H, Peters JA, Liu Z, Sebastian M, Malliakas CD, Androulakis J et al. Crystal growth and characterization of the X-ray and γ-ray detector material Cs 2Hg 6S 7 Crystal Growth and Design. 2012 Jun 6;12(6):3250-3256. https://doi.org/10.1021/cg300385s
Li, Hao ; Peters, John A. ; Liu, Zhifu ; Sebastian, Maria ; Malliakas, Christos D. ; Androulakis, John ; Zhao, Lidong ; Chung, In ; Nguyen, Sandy L. ; Johnsen, Simon ; Wessels, Bruce W. ; Kanatzidis, Mercouri G. / Crystal growth and characterization of the X-ray and γ-ray detector material Cs 2Hg 6S 7 In: Crystal Growth and Design. 2012 ; Vol. 12, No. 6. pp. 3250-3256.
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