Crystal structure, electronic band structure, electrical resistivity and scanning probe microscopy studies of layered compound MoOCl2

P. Zönnchen, G. Thiele, C. Hess, C. Schlenker, H. Bengel, H. J. Cantow, S. N. Magonov, D. K. Seo, M. H. Whangbo

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Abstract

The structure of MoOCl2 was determined by single crystal X-ray diffraction, and the electronic structure of MoOCl2 was calculated by the extended Hückel tight binding method. The electrical resistivity and magnetoresistivity measurements of MoOCl2 were performed, and the surfaces of MoOCl2 samples were characterized by scanning tunneling microscopy (STM) and atomic force microscopy (AFM). MoOCl2 has stacking faults in crystal structure and is a metal. The STM and AFM images of MoOCl2 differ substantially in brightness pattern.

Original languageEnglish
Pages (from-to)295-300
Number of pages6
JournalNew Journal of Chemistry
Volume20
Issue number3
Publication statusPublished - Jan 1 1996

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ASJC Scopus subject areas

  • Catalysis
  • Chemistry(all)
  • Materials Chemistry

Cite this

Zönnchen, P., Thiele, G., Hess, C., Schlenker, C., Bengel, H., Cantow, H. J., Magonov, S. N., Seo, D. K., & Whangbo, M. H. (1996). Crystal structure, electronic band structure, electrical resistivity and scanning probe microscopy studies of layered compound MoOCl2 New Journal of Chemistry, 20(3), 295-300.