Defect structure studies of bulk and nano-indium-tin oxide

G. B. González; T. O. Mason; J. P. Quintana; O. Warschkow; D. E. Ellis; J. H. Hwang; J. P. Hodges; J. D. Jorgensen

doi:10.1063/1.1783610

Defect structure studies of bulk and nano-indium-tin oxide

G. B. González, T. O. Mason, J. P. Quintana, O. Warschkow, D. E. Ellis, J. H. Hwang, J. P. Hodges, J. D. Jorgensen

Northwestern University

Research output: Contribution to journal › Article

147 Citations (Scopus)

Abstract

Structural defect structure of indium tin oxide (ITO) was analyzed using high-resolution synchrotron x-ray diffraction, time of flight neutron powder diffraction and extended x-ray absorption fine structure. Correlation between structural results and electrical properties was made using measured electrical conductivity and thermopower. It was observed that the position of O _i species in ITO samples were displaced along the direction towards the plane formed by d cations and away from the b cations. The structural results show atomic positions, cation distributions, and oxygen interstitial populations for oxidized and reduced materials.

Original language	English
Pages (from-to)	3912-3920
Number of pages	9
Journal	Journal of Applied Physics
Volume	96
Issue number	7
DOIs	https://doi.org/10.1063/1.1783610
Publication status	Published - Oct 1 2004

ASJC Scopus subject areas

Physics and Astronomy(all)

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González, G. B., Mason, T. O., Quintana, J. P., Warschkow, O., Ellis, D. E., Hwang, J. H., Hodges, J. P., & Jorgensen, J. D. (2004). Defect structure studies of bulk and nano-indium-tin oxide. Journal of Applied Physics, 96(7), 3912-3920. https://doi.org/10.1063/1.1783610

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abstract = "Structural defect structure of indium tin oxide (ITO) was analyzed using high-resolution synchrotron x-ray diffraction, time of flight neutron powder diffraction and extended x-ray absorption fine structure. Correlation between structural results and electrical properties was made using measured electrical conductivity and thermopower. It was observed that the position of O i species in ITO samples were displaced along the direction towards the plane formed by d cations and away from the b cations. The structural results show atomic positions, cation distributions, and oxygen interstitial populations for oxidized and reduced materials.",

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AU - Quintana, J. P.

AU - Warschkow, O.

AU - Ellis, D. E.

AU - Hwang, J. H.

AU - Hodges, J. P.

AU - Jorgensen, J. D.

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AB - Structural defect structure of indium tin oxide (ITO) was analyzed using high-resolution synchrotron x-ray diffraction, time of flight neutron powder diffraction and extended x-ray absorption fine structure. Correlation between structural results and electrical properties was made using measured electrical conductivity and thermopower. It was observed that the position of O i species in ITO samples were displaced along the direction towards the plane formed by d cations and away from the b cations. The structural results show atomic positions, cation distributions, and oxygen interstitial populations for oxidized and reduced materials.

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