Degradation of nonencapsulated polymer-based light-emitting diodes: Noise and morphology

Vadim N. Savvate'ev, Aharon V. Yakimov, Dan Davidov, Roman M. Pogreb, Ronny Neumann, Yair Avny

Research output: Contribution to journalArticle

76 Citations (Scopus)

Abstract

We show that the degradation of a nonencapsulated polymer-based light-emitting diode (LED) is accompanied by the appearance of strong fluctuations, - that is noise both in the radiance and in the film resistance. We demonstrate a correlation between the morphological changes which occur during the degradation process and the noise, suggesting that the sampling of noise during LED operation can be used as a very efficient tool to predict the approaching failure of LEDs in real-life applications. The morphological changes in LED degradation are essentially a two-stage process. First, there is formation of "bubbles" at the metal-polymer interface due to delamination of the polymer film from the metal surface. Second, carbonized areas in the form of "black spots" are formed. Accumulation of carbonized areas leads to short and/or open circuits and final LED failure.

Original languageEnglish
Pages (from-to)3344-3346
Number of pages3
JournalApplied Physics Letters
Volume71
Issue number23
Publication statusPublished - Dec 8 1997

Fingerprint

light emitting diodes
degradation
polymers
radiance
metal surfaces
bubbles
sampling
metals

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Savvate'ev, V. N., Yakimov, A. V., Davidov, D., Pogreb, R. M., Neumann, R., & Avny, Y. (1997). Degradation of nonencapsulated polymer-based light-emitting diodes: Noise and morphology. Applied Physics Letters, 71(23), 3344-3346.

Degradation of nonencapsulated polymer-based light-emitting diodes : Noise and morphology. / Savvate'ev, Vadim N.; Yakimov, Aharon V.; Davidov, Dan; Pogreb, Roman M.; Neumann, Ronny; Avny, Yair.

In: Applied Physics Letters, Vol. 71, No. 23, 08.12.1997, p. 3344-3346.

Research output: Contribution to journalArticle

Savvate'ev, VN, Yakimov, AV, Davidov, D, Pogreb, RM, Neumann, R & Avny, Y 1997, 'Degradation of nonencapsulated polymer-based light-emitting diodes: Noise and morphology', Applied Physics Letters, vol. 71, no. 23, pp. 3344-3346.
Savvate'ev VN, Yakimov AV, Davidov D, Pogreb RM, Neumann R, Avny Y. Degradation of nonencapsulated polymer-based light-emitting diodes: Noise and morphology. Applied Physics Letters. 1997 Dec 8;71(23):3344-3346.
Savvate'ev, Vadim N. ; Yakimov, Aharon V. ; Davidov, Dan ; Pogreb, Roman M. ; Neumann, Ronny ; Avny, Yair. / Degradation of nonencapsulated polymer-based light-emitting diodes : Noise and morphology. In: Applied Physics Letters. 1997 ; Vol. 71, No. 23. pp. 3344-3346.
@article{1bbedba7c10046d6a5128ef1ade9a3c0,
title = "Degradation of nonencapsulated polymer-based light-emitting diodes: Noise and morphology",
abstract = "We show that the degradation of a nonencapsulated polymer-based light-emitting diode (LED) is accompanied by the appearance of strong fluctuations, - that is noise both in the radiance and in the film resistance. We demonstrate a correlation between the morphological changes which occur during the degradation process and the noise, suggesting that the sampling of noise during LED operation can be used as a very efficient tool to predict the approaching failure of LEDs in real-life applications. The morphological changes in LED degradation are essentially a two-stage process. First, there is formation of {"}bubbles{"} at the metal-polymer interface due to delamination of the polymer film from the metal surface. Second, carbonized areas in the form of {"}black spots{"} are formed. Accumulation of carbonized areas leads to short and/or open circuits and final LED failure.",
author = "Savvate'ev, {Vadim N.} and Yakimov, {Aharon V.} and Dan Davidov and Pogreb, {Roman M.} and Ronny Neumann and Yair Avny",
year = "1997",
month = "12",
day = "8",
language = "English",
volume = "71",
pages = "3344--3346",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "23",

}

TY - JOUR

T1 - Degradation of nonencapsulated polymer-based light-emitting diodes

T2 - Noise and morphology

AU - Savvate'ev, Vadim N.

AU - Yakimov, Aharon V.

AU - Davidov, Dan

AU - Pogreb, Roman M.

AU - Neumann, Ronny

AU - Avny, Yair

PY - 1997/12/8

Y1 - 1997/12/8

N2 - We show that the degradation of a nonencapsulated polymer-based light-emitting diode (LED) is accompanied by the appearance of strong fluctuations, - that is noise both in the radiance and in the film resistance. We demonstrate a correlation between the morphological changes which occur during the degradation process and the noise, suggesting that the sampling of noise during LED operation can be used as a very efficient tool to predict the approaching failure of LEDs in real-life applications. The morphological changes in LED degradation are essentially a two-stage process. First, there is formation of "bubbles" at the metal-polymer interface due to delamination of the polymer film from the metal surface. Second, carbonized areas in the form of "black spots" are formed. Accumulation of carbonized areas leads to short and/or open circuits and final LED failure.

AB - We show that the degradation of a nonencapsulated polymer-based light-emitting diode (LED) is accompanied by the appearance of strong fluctuations, - that is noise both in the radiance and in the film resistance. We demonstrate a correlation between the morphological changes which occur during the degradation process and the noise, suggesting that the sampling of noise during LED operation can be used as a very efficient tool to predict the approaching failure of LEDs in real-life applications. The morphological changes in LED degradation are essentially a two-stage process. First, there is formation of "bubbles" at the metal-polymer interface due to delamination of the polymer film from the metal surface. Second, carbonized areas in the form of "black spots" are formed. Accumulation of carbonized areas leads to short and/or open circuits and final LED failure.

UR - http://www.scopus.com/inward/record.url?scp=0031560335&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0031560335&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0031560335

VL - 71

SP - 3344

EP - 3346

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 23

ER -