Density of interface states, electron traps, and hole traps as a function of the nitrogen density in SiO2 on SiC

John Rozen, Sarit Dhar, M. E. Zvanut, J. R. Williams, L. C. Feldman

Research output: Contribution to journalArticlepeer-review

136 Citations (Scopus)

Fingerprint Dive into the research topics of 'Density of interface states, electron traps, and hole traps as a function of the nitrogen density in SiO<sub>2</sub> on SiC'. Together they form a unique fingerprint.

Physics & Astronomy