Detecting elusive surface atoms with atomic force microscopy

Mark C Hersam, Yip Wah Chung

Research output: Contribution to journalArticle

3 Citations (Scopus)
Original languageEnglish
Pages (from-to)12531-12532
Number of pages2
JournalProceedings of the National Academy of Sciences of the United States of America
Volume100
Issue number22
DOIs
Publication statusPublished - Oct 28 2003

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Scanning Tunnelling Microscopy
Atomic Force Microscopy
Sensitivity and Specificity

ASJC Scopus subject areas

  • Genetics
  • General

Cite this

Detecting elusive surface atoms with atomic force microscopy. / Hersam, Mark C; Chung, Yip Wah.

In: Proceedings of the National Academy of Sciences of the United States of America, Vol. 100, No. 22, 28.10.2003, p. 12531-12532.

Research output: Contribution to journalArticle

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