Determination of Oxygen Atomic Positions in a Ga-In-Sn-O Ceramic Using Direct Methods and Electron Diffraction

W. Sinkler, L. D. Marks, D. D. Edwards, Thomas O Mason, Kenneth R Poeppelmeier, Z. Hu, J. D. Jorgensen

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Abstract

Direct methods using dynamical transmission electron diffraction (TED) intensities is applied to the solution of (Ga,In)2SnO5. Dynamical diffraction effects in the TED data lead to an emphasis of oxygen positions in the structure. Application of direct methods to dynamical diffraction intensities represents a valuable new technique for obtaining approximate atom positions of light elements in ceramics using an experiment which is simple to perform and does not require a single crystal.

Original languageEnglish
Pages (from-to)145-149
Number of pages5
JournalJournal of Solid State Chemistry
Volume136
Issue number1
DOIs
Publication statusPublished - Feb 15 1998

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ASJC Scopus subject areas

  • Inorganic Chemistry
  • Physical and Theoretical Chemistry
  • Materials Chemistry

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