Determination of Oxygen Atomic Positions in a Ga-In-Sn-O Ceramic Using Direct Methods and Electron Diffraction

W. Sinkler, L. D. Marks, D. D. Edwards, T. O. Mason, K. R. Poeppelmeier, Z. Hu, J. D. Jorgensen

Research output: Contribution to journalEditorial

26 Citations (Scopus)

Abstract

Direct methods using dynamical transmission electron diffraction (TED) intensities is applied to the solution of (Ga,In) 2 SnO 5 . Dynamical diffraction effects in the TED data lead to an emphasis of oxygen positions in the structure. Application of direct methods to dynamical diffraction intensities represents a valuable new technique for obtaining approximate atom positions of light elements in ceramics using an experiment which is simple to perform and does not require a single crystal.

Original languageEnglish
Pages (from-to)145-149
Number of pages5
JournalJournal of Solid State Chemistry
Volume136
Issue number1
DOIs
Publication statusPublished - Feb 15 1998

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Condensed Matter Physics
  • Physical and Theoretical Chemistry
  • Inorganic Chemistry
  • Materials Chemistry

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