Determining the radial pair-distribution function within intergranular amorphous films by numerical nanodiffraction

C. T. Koch, Steve Garofalini

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

We report on an alternative method to electron nanodiffraction and fluctuation microscopy for the determination of the reduced density function G(r) of amorphous areas with small cross-sections. This method is based on the numerical extraction of diffraction data from the complex-valued exit-face wave function as obtained by HRTEM focal series reconstruction or electron holography. Since it is thus possible to obtain "diffraction data" from rectangular areas of any aspect ratio, this method is particularly suited for intergranular glassy films of only 1-2nm width, but lengths of several 100nm. A critical comparison of this method with the already established nanodiffraction and fluctuation microscopy will be made.

Original languageEnglish
Pages (from-to)383-388
Number of pages6
JournalUltramicroscopy
Volume106
Issue number4-5
DOIs
Publication statusPublished - Mar 2006

Fingerprint

Amorphous films
Distribution functions
Microscopic examination
Diffraction
distribution functions
Electron holography
microscopy
Wave functions
diffraction
holography
Probability density function
aspect ratio
Aspect ratio
electrons
wave functions
Electrons
cross sections

Keywords

  • Electron nanodiffraction
  • Focal series reconstruction
  • Intergranular glassy films

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation

Cite this

Determining the radial pair-distribution function within intergranular amorphous films by numerical nanodiffraction. / Koch, C. T.; Garofalini, Steve.

In: Ultramicroscopy, Vol. 106, No. 4-5, 03.2006, p. 383-388.

Research output: Contribution to journalArticle

@article{e1d80537795245419839480800421c79,
title = "Determining the radial pair-distribution function within intergranular amorphous films by numerical nanodiffraction",
abstract = "We report on an alternative method to electron nanodiffraction and fluctuation microscopy for the determination of the reduced density function G(r) of amorphous areas with small cross-sections. This method is based on the numerical extraction of diffraction data from the complex-valued exit-face wave function as obtained by HRTEM focal series reconstruction or electron holography. Since it is thus possible to obtain {"}diffraction data{"} from rectangular areas of any aspect ratio, this method is particularly suited for intergranular glassy films of only 1-2nm width, but lengths of several 100nm. A critical comparison of this method with the already established nanodiffraction and fluctuation microscopy will be made.",
keywords = "Electron nanodiffraction, Focal series reconstruction, Intergranular glassy films",
author = "Koch, {C. T.} and Steve Garofalini",
year = "2006",
month = "3",
doi = "10.1016/j.ultramic.2005.11.005",
language = "English",
volume = "106",
pages = "383--388",
journal = "Ultramicroscopy",
issn = "0304-3991",
publisher = "Elsevier",
number = "4-5",

}

TY - JOUR

T1 - Determining the radial pair-distribution function within intergranular amorphous films by numerical nanodiffraction

AU - Koch, C. T.

AU - Garofalini, Steve

PY - 2006/3

Y1 - 2006/3

N2 - We report on an alternative method to electron nanodiffraction and fluctuation microscopy for the determination of the reduced density function G(r) of amorphous areas with small cross-sections. This method is based on the numerical extraction of diffraction data from the complex-valued exit-face wave function as obtained by HRTEM focal series reconstruction or electron holography. Since it is thus possible to obtain "diffraction data" from rectangular areas of any aspect ratio, this method is particularly suited for intergranular glassy films of only 1-2nm width, but lengths of several 100nm. A critical comparison of this method with the already established nanodiffraction and fluctuation microscopy will be made.

AB - We report on an alternative method to electron nanodiffraction and fluctuation microscopy for the determination of the reduced density function G(r) of amorphous areas with small cross-sections. This method is based on the numerical extraction of diffraction data from the complex-valued exit-face wave function as obtained by HRTEM focal series reconstruction or electron holography. Since it is thus possible to obtain "diffraction data" from rectangular areas of any aspect ratio, this method is particularly suited for intergranular glassy films of only 1-2nm width, but lengths of several 100nm. A critical comparison of this method with the already established nanodiffraction and fluctuation microscopy will be made.

KW - Electron nanodiffraction

KW - Focal series reconstruction

KW - Intergranular glassy films

UR - http://www.scopus.com/inward/record.url?scp=33344462002&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33344462002&partnerID=8YFLogxK

U2 - 10.1016/j.ultramic.2005.11.005

DO - 10.1016/j.ultramic.2005.11.005

M3 - Article

VL - 106

SP - 383

EP - 388

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

IS - 4-5

ER -