Dimensional reduction: A design tool for new radiation detection materials

John Androulakis, Sebastian C. Peter, Hao Li, Christos D. Malliakas, John A. Peters, Zhifu Liu, Bruce W. Wessels, Jung Hwan Song, Hosub Jin, Arthur J. Freeman, Mercouri G. Kanatzidis

Research output: Contribution to journalArticle

96 Citations (Scopus)

Abstract

Semiconductor materials for efficient hard radiation detection are identified by combining a powerful chemical concept called dimensional reduction and precise theoretical electronic structure calculations. After more than 50 years of research and development in the field, this constitutes a significant step forward in the search for new detector materials.

Original languageEnglish
Pages (from-to)4163-4167
Number of pages5
JournalAdvanced Materials
Volume23
Issue number36
DOIs
Publication statusPublished - Sep 22 2011

Keywords

  • radiation detection
  • semiconductors
  • stimuli-responsive materials

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

Fingerprint Dive into the research topics of 'Dimensional reduction: A design tool for new radiation detection materials'. Together they form a unique fingerprint.

  • Cite this

    Androulakis, J., Peter, S. C., Li, H., Malliakas, C. D., Peters, J. A., Liu, Z., Wessels, B. W., Song, J. H., Jin, H., Freeman, A. J., & Kanatzidis, M. G. (2011). Dimensional reduction: A design tool for new radiation detection materials. Advanced Materials, 23(36), 4163-4167. https://doi.org/10.1002/adma.201102450