E-beam-referenced work-function evaluation in an x-ray photoelectron spectrometer

H. Cohen, C. Nogues, I. Zon, I. Lubomirsky

Research output: Contribution to journalArticlepeer-review

32 Citations (Scopus)


A method for work-function evaluation is proposed, based on recording the shift of x-ray photoelectron signals from a surface irradiated by low-energy electrons. The method is capable of measuring samples with very low conductivity, poor back contacts, and high dielectric constants. The method is also applicable to magnetic materials and can be particularly effective for studies of multilayer and heterogeneous systems.

Original languageEnglish
Article number113701
JournalJournal of Applied Physics
Issue number11
Publication statusPublished - Jun 30 2005

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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