E-beam-referenced work-function evaluation in an x-ray photoelectron spectrometer

H. Cohen, C. Nogues, I. Zon, Igor Lubomirsky

Research output: Contribution to journalArticle

29 Citations (Scopus)

Abstract

A method for work-function evaluation is proposed, based on recording the shift of x-ray photoelectron signals from a surface irradiated by low-energy electrons. The method is capable of measuring samples with very low conductivity, poor back contacts, and high dielectric constants. The method is also applicable to magnetic materials and can be particularly effective for studies of multilayer and heterogeneous systems.

Original languageEnglish
Article number113701
JournalJournal of Applied Physics
Volume97
Issue number11
DOIs
Publication statusPublished - 2005

Fingerprint

low conductivity
magnetic materials
photoelectrons
recording
spectrometers
electron energy
permittivity
evaluation
shift
x rays

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

Cite this

E-beam-referenced work-function evaluation in an x-ray photoelectron spectrometer. / Cohen, H.; Nogues, C.; Zon, I.; Lubomirsky, Igor.

In: Journal of Applied Physics, Vol. 97, No. 11, 113701, 2005.

Research output: Contribution to journalArticle

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