Effect of bond-length alternation in molecular wires

James G. Kushmerick, David B. Holt, Steven K. Pollack, Mark A. Ratner, John C. Yang, Terence L. Schull, Jawad Naciri, Martin H. Moore, Ranganathan Shashidhar

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Abstract

Current-voltage (I-V) characteristics for metal-molecule-metal junctions formed from three classes of molecules measured with a simple crossed-wire molecular electronics test-bed are reported. Junction conductance as a function of molecular structure is consistent with I-V characteristics calculated from extended Hückel theory coupled with a Green's function approach, and can be understood on the basis of bond-length alternation.

Original languageEnglish
Pages (from-to)10654-10655
Number of pages2
JournalJournal of the American Chemical Society
Volume124
Issue number36
DOIs
Publication statusPublished - Sep 11 2002

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ASJC Scopus subject areas

  • Catalysis
  • Chemistry(all)
  • Biochemistry
  • Colloid and Surface Chemistry

Cite this

Kushmerick, J. G., Holt, D. B., Pollack, S. K., Ratner, M. A., Yang, J. C., Schull, T. L., Naciri, J., Moore, M. H., & Shashidhar, R. (2002). Effect of bond-length alternation in molecular wires. Journal of the American Chemical Society, 124(36), 10654-10655. https://doi.org/10.1021/ja027090n