Effect of bond-length alternation in molecular wires

James G. Kushmerick; David B. Holt; Steven K. Pollack; Mark A. Ratner; John C. Yang; Terence L. Schull; Jawad Naciri; Martin H. Moore; Ranganathan Shashidhar

doi:10.1021/ja027090n

Effect of bond-length alternation in molecular wires

James G. Kushmerick, David B. Holt, Steven K. Pollack, Mark A. Ratner, John C. Yang, Terence L. Schull, Jawad Naciri, Martin H. Moore, Ranganathan Shashidhar

Northwestern University

Research output: Contribution to journal › Article › peer-review

272 Citations (Scopus)

Abstract

Current-voltage (I-V) characteristics for metal-molecule-metal junctions formed from three classes of molecules measured with a simple crossed-wire molecular electronics test-bed are reported. Junction conductance as a function of molecular structure is consistent with I-V characteristics calculated from extended Hückel theory coupled with a Green's function approach, and can be understood on the basis of bond-length alternation.

Original language	English
Pages (from-to)	10654-10655
Number of pages	2
Journal	Journal of the American Chemical Society
Volume	124
Issue number	36
DOIs	https://doi.org/10.1021/ja027090n
Publication status	Published - Sep 11 2002

ASJC Scopus subject areas

Catalysis
Chemistry(all)
Biochemistry
Colloid and Surface Chemistry

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10.1021/ja027090n

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Effect of bond-length alternation in molecular wires. / Kushmerick, James G.; Holt, David B.; Pollack, Steven K.; Ratner, Mark A.; Yang, John C.; Schull, Terence L.; Naciri, Jawad; Moore, Martin H.; Shashidhar, Ranganathan.

In: Journal of the American Chemical Society, Vol. 124, No. 36, 11.09.2002, p. 10654-10655.

Research output: Contribution to journal › Article › peer-review

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