Effect of oxygen partial pressure on the in situ growth of Y-Ba-Cu-O thin films on SrTiO3

J. Q. Zheng, M. C. Shih, S. Williams, S. J. Lee, Hiroshi Kajiyama, X. K. Wang, Z. Zhao, K. Viani, S. Jacobson, P. Dutta, Robert P. H. Chang, J. B. Ketterson, T. Roberts, R. T. Kampwirth, K. E. Gray

Research output: Contribution to journalArticle

30 Citations (Scopus)

Abstract

The evolution of YBCO film growth with thickness at various oxygen pressures was observed by in situ synchrotron x-ray diffraction in real time. When the films were deposited at 2 Å/s and 730°C under higher oxygen partial pressures (in an Ar/O2 mixture of 90 mTorr), the nucleation was observed to have c-axis orientation. After the films reached a critical thickness, the growth of the YBCO film changed from c axis to a axis and then propagated epitaxially. This provides evidence that a-axis epitaxial growth nucleates on a c-axis base. The critical thickness reflects the competition between the growth of the c and a axes, which is determined by the oxygen partial pressure in the process of thin-film formation. The a-axis oriented films showed a very sharp rocking curve (less than 0.1°) which indicates a very high structural quality. For very low oxygen partial pressures, the in situ growth process was very similar, but the initial nuclei involve a second phase mixed with a small amount of c-axis "123" phase. The nucleation and growth mechanisms of in situ YBCO films are discussed.

Original languageEnglish
Pages (from-to)231-233
Number of pages3
JournalApplied Physics Letters
Volume59
Issue number2
DOIs
Publication statusPublished - 1991

Fingerprint

partial pressure
oxygen
thin films
nucleation
synchrotrons
x ray diffraction
nuclei
curves

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Zheng, J. Q., Shih, M. C., Williams, S., Lee, S. J., Kajiyama, H., Wang, X. K., ... Gray, K. E. (1991). Effect of oxygen partial pressure on the in situ growth of Y-Ba-Cu-O thin films on SrTiO3 Applied Physics Letters, 59(2), 231-233. https://doi.org/10.1063/1.105975

Effect of oxygen partial pressure on the in situ growth of Y-Ba-Cu-O thin films on SrTiO3 . / Zheng, J. Q.; Shih, M. C.; Williams, S.; Lee, S. J.; Kajiyama, Hiroshi; Wang, X. K.; Zhao, Z.; Viani, K.; Jacobson, S.; Dutta, P.; Chang, Robert P. H.; Ketterson, J. B.; Roberts, T.; Kampwirth, R. T.; Gray, K. E.

In: Applied Physics Letters, Vol. 59, No. 2, 1991, p. 231-233.

Research output: Contribution to journalArticle

Zheng, JQ, Shih, MC, Williams, S, Lee, SJ, Kajiyama, H, Wang, XK, Zhao, Z, Viani, K, Jacobson, S, Dutta, P, Chang, RPH, Ketterson, JB, Roberts, T, Kampwirth, RT & Gray, KE 1991, 'Effect of oxygen partial pressure on the in situ growth of Y-Ba-Cu-O thin films on SrTiO3 ', Applied Physics Letters, vol. 59, no. 2, pp. 231-233. https://doi.org/10.1063/1.105975
Zheng, J. Q. ; Shih, M. C. ; Williams, S. ; Lee, S. J. ; Kajiyama, Hiroshi ; Wang, X. K. ; Zhao, Z. ; Viani, K. ; Jacobson, S. ; Dutta, P. ; Chang, Robert P. H. ; Ketterson, J. B. ; Roberts, T. ; Kampwirth, R. T. ; Gray, K. E. / Effect of oxygen partial pressure on the in situ growth of Y-Ba-Cu-O thin films on SrTiO3 In: Applied Physics Letters. 1991 ; Vol. 59, No. 2. pp. 231-233.
@article{4e0f069adf7f45dcb61175ad18f99653,
title = "Effect of oxygen partial pressure on the in situ growth of Y-Ba-Cu-O thin films on SrTiO3",
abstract = "The evolution of YBCO film growth with thickness at various oxygen pressures was observed by in situ synchrotron x-ray diffraction in real time. When the films were deposited at 2 {\AA}/s and 730°C under higher oxygen partial pressures (in an Ar/O2 mixture of 90 mTorr), the nucleation was observed to have c-axis orientation. After the films reached a critical thickness, the growth of the YBCO film changed from c axis to a axis and then propagated epitaxially. This provides evidence that a-axis epitaxial growth nucleates on a c-axis base. The critical thickness reflects the competition between the growth of the c and a axes, which is determined by the oxygen partial pressure in the process of thin-film formation. The a-axis oriented films showed a very sharp rocking curve (less than 0.1°) which indicates a very high structural quality. For very low oxygen partial pressures, the in situ growth process was very similar, but the initial nuclei involve a second phase mixed with a small amount of c-axis {"}123{"} phase. The nucleation and growth mechanisms of in situ YBCO films are discussed.",
author = "Zheng, {J. Q.} and Shih, {M. C.} and S. Williams and Lee, {S. J.} and Hiroshi Kajiyama and Wang, {X. K.} and Z. Zhao and K. Viani and S. Jacobson and P. Dutta and Chang, {Robert P. H.} and Ketterson, {J. B.} and T. Roberts and Kampwirth, {R. T.} and Gray, {K. E.}",
year = "1991",
doi = "10.1063/1.105975",
language = "English",
volume = "59",
pages = "231--233",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "2",

}

TY - JOUR

T1 - Effect of oxygen partial pressure on the in situ growth of Y-Ba-Cu-O thin films on SrTiO3

AU - Zheng, J. Q.

AU - Shih, M. C.

AU - Williams, S.

AU - Lee, S. J.

AU - Kajiyama, Hiroshi

AU - Wang, X. K.

AU - Zhao, Z.

AU - Viani, K.

AU - Jacobson, S.

AU - Dutta, P.

AU - Chang, Robert P. H.

AU - Ketterson, J. B.

AU - Roberts, T.

AU - Kampwirth, R. T.

AU - Gray, K. E.

PY - 1991

Y1 - 1991

N2 - The evolution of YBCO film growth with thickness at various oxygen pressures was observed by in situ synchrotron x-ray diffraction in real time. When the films were deposited at 2 Å/s and 730°C under higher oxygen partial pressures (in an Ar/O2 mixture of 90 mTorr), the nucleation was observed to have c-axis orientation. After the films reached a critical thickness, the growth of the YBCO film changed from c axis to a axis and then propagated epitaxially. This provides evidence that a-axis epitaxial growth nucleates on a c-axis base. The critical thickness reflects the competition between the growth of the c and a axes, which is determined by the oxygen partial pressure in the process of thin-film formation. The a-axis oriented films showed a very sharp rocking curve (less than 0.1°) which indicates a very high structural quality. For very low oxygen partial pressures, the in situ growth process was very similar, but the initial nuclei involve a second phase mixed with a small amount of c-axis "123" phase. The nucleation and growth mechanisms of in situ YBCO films are discussed.

AB - The evolution of YBCO film growth with thickness at various oxygen pressures was observed by in situ synchrotron x-ray diffraction in real time. When the films were deposited at 2 Å/s and 730°C under higher oxygen partial pressures (in an Ar/O2 mixture of 90 mTorr), the nucleation was observed to have c-axis orientation. After the films reached a critical thickness, the growth of the YBCO film changed from c axis to a axis and then propagated epitaxially. This provides evidence that a-axis epitaxial growth nucleates on a c-axis base. The critical thickness reflects the competition between the growth of the c and a axes, which is determined by the oxygen partial pressure in the process of thin-film formation. The a-axis oriented films showed a very sharp rocking curve (less than 0.1°) which indicates a very high structural quality. For very low oxygen partial pressures, the in situ growth process was very similar, but the initial nuclei involve a second phase mixed with a small amount of c-axis "123" phase. The nucleation and growth mechanisms of in situ YBCO films are discussed.

UR - http://www.scopus.com/inward/record.url?scp=0000458476&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0000458476&partnerID=8YFLogxK

U2 - 10.1063/1.105975

DO - 10.1063/1.105975

M3 - Article

AN - SCOPUS:0000458476

VL - 59

SP - 231

EP - 233

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 2

ER -