Effects of interfacial energetics on the effective surface recombination velocity of Si/liquid contacts

Florian Gstrein, David J. Michalak, William J. Royea, Nathan S Lewis

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Abstract

The effects of interfacial energetics on the effective surface recombination velocity of Si/liquid contacts were discussed. Carrier decay measurements were performed under both low-level injection conditions using a contactless rf photoconductivity decay apparatus. Results showed low effective surface recombination velocities due to formation of an electron accumulation layer at the Si surface.

Original languageEnglish
Pages (from-to)2950-2961
Number of pages12
JournalJournal of Physical Chemistry B
Volume106
Issue number11
DOIs
Publication statusPublished - Mar 21 2002

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ASJC Scopus subject areas

  • Physical and Theoretical Chemistry

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