Effects of Mg on the electrical characteristics and thermal stability of Mgx Zn1-x O thin film transistors

Chieh Jen Ku, Ziqing Duan, Pavel I. Reyes, Yicheng Lu, Yi Xu, Chien Lan Hsueh, Eric Garfunkel

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Abstract

The effects of the Mg composition (x=0, 0.06, and 0.10) on the electrical characteristics and thermal stability of Mgx Zn1-x O thin film transistors (TFTs) are investigated. The Mg0.06 Zn0.94 O TFT shows the smallest subthreshold slope and highest field effect mobility. The O1s spectra of x-ray photoelectron spectroscopy measurements indicate that the oxygen vacancies are reduced in Mg0.06 Zn0.94 O relative to a pure ZnO channel device. Mg0.06 Zn0.94 O TFTs also show higher thermal stability compared to the pure ZnO TFTs, which is mainly attributed to the suppression of oxygen vacancies in the channel.

Original languageEnglish
Article number123511
JournalApplied Physics Letters
Volume98
Issue number12
DOIs
Publication statusPublished - Mar 21 2011

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thermal stability
transistors
thin films
oxygen
x ray spectroscopy
retarding
photoelectron spectroscopy
slopes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Effects of Mg on the electrical characteristics and thermal stability of Mgx Zn1-x O thin film transistors. / Ku, Chieh Jen; Duan, Ziqing; Reyes, Pavel I.; Lu, Yicheng; Xu, Yi; Hsueh, Chien Lan; Garfunkel, Eric.

In: Applied Physics Letters, Vol. 98, No. 12, 123511, 21.03.2011.

Research output: Contribution to journalArticle

Ku, Chieh Jen ; Duan, Ziqing ; Reyes, Pavel I. ; Lu, Yicheng ; Xu, Yi ; Hsueh, Chien Lan ; Garfunkel, Eric. / Effects of Mg on the electrical characteristics and thermal stability of Mgx Zn1-x O thin film transistors. In: Applied Physics Letters. 2011 ; Vol. 98, No. 12.
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