Effects of N incorporation on electron traps at SiO2/SiC interfaces

A. F. Basile, S. Dhar, J. R. Williams, L. C. Feldman, P. M. Mooney

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Fingerprint Dive into the research topics of 'Effects of N incorporation on electron traps at SiO<sub>2</sub>/SiC interfaces'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science

Physics & Astronomy