Effects of scaling thickness and niobium doping level on ferroelectric thin film capacitor memory operation

Francis K. Chai, R. D. Schrimpf, J. R. Brews, Dunbar P Birnie, K. F. Galloway, R. N. Vogt, M. N. Orr

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Fingerprint Dive into the research topics of 'Effects of scaling thickness and niobium doping level on ferroelectric thin film capacitor memory operation'. Together they form a unique fingerprint.

Engineering & Materials Science