Elastic deformations during phase transition in freestanding BaTiO3 thin films

Jaya P. Nair, Natalie Stavitski, Ilya Zon, Konstantin Gartsman, Igor Lubomirsky

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Elastic deformations during phase transition in freestanding BaTiO3 thin films were investigated. BaTiO3 films were prepared by sol-gel technique or RF magnetron sputtering on silicon substrates, covered by randomly oriented 120 nm thick Al2O3. The as-deposited films were under tensile stress of 100-170 MPa and did not show neither pyroelectric nor piezoelectric properties. Partial substrate removal caused the freestanding films to expand laterally by 0.3-0.5% and corrugate. Dielectric constant of the freestanding films (620±10) was found to be significantly higher than that of the substrate supported films (110±20). The freestanding films showed detectable piezoelectric effect, which indicated that the lateral expansion was originated from the substrate-suppressed cubic-tetragonal phase transition.

Original languageEnglish
Title of host publicationMaterials Research Society Symposium - Proceedings
EditorsR Wentzcovitch, A Navrotsky, K Poeppelmeier
Pages245-250
Number of pages6
Volume718
Publication statusPublished - 2002
EventPerovskite Materials - San Francisco, CA, United States
Duration: Apr 1 2002Apr 5 2002

Other

OtherPerovskite Materials
CountryUnited States
CitySan Francisco, CA
Period4/1/024/5/02

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Fingerprint Dive into the research topics of 'Elastic deformations during phase transition in freestanding BaTiO3 thin films'. Together they form a unique fingerprint.

  • Cite this

    Nair, J. P., Stavitski, N., Zon, I., Gartsman, K., & Lubomirsky, I. (2002). Elastic deformations during phase transition in freestanding BaTiO3 thin films. In R. Wentzcovitch, A. Navrotsky, & K. Poeppelmeier (Eds.), Materials Research Society Symposium - Proceedings (Vol. 718, pp. 245-250)