Electrical characterization of Si Microwires and of Si microwire/conducting polymer composite junctions

Iman Yahyaie, Kevin McEleney, Michael Walter, Derek R. Oliver, Douglas J. Thomson, Michael S. Freund, Nathan S. Lewis

Research output: Contribution to journalArticle

17 Citations (Scopus)

Abstract

The electrical (DC) behavior of single silicon microwires has been determined by the use of tungsten probes to make ohmic contact to the silicon microwires. The basic electrical properties of the microwires, such as their DC resistivity and the doping distribution along the length of the microwires, were investigated using this approach. The technique was also used to characterize the junction between silicon microwires and conducting polymers to assess the suitability of such contacts for use in a proposed artificial photosynthesis system.

Original languageEnglish
Pages (from-to)675-680
Number of pages6
JournalJournal of Physical Chemistry Letters
Volume2
Issue number6
DOIs
Publication statusPublished - Mar 17 2011

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ASJC Scopus subject areas

  • Materials Science(all)
  • Physical and Theoretical Chemistry

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