Electrical, thermal, and mechanical characterization of novel segmented-leg thermoelectric modules

Jonathan D'Angelo, Eldon D. Case, Nuraddin Matchanov, Chun I. Wu, Timothy P. Hogan, James Barnard, Charles Cauchy, Terry Hendricks, Mercouri G. Kanatzidis

Research output: Contribution to journalArticle

43 Citations (Scopus)

Abstract

In this paper we report on the electrical, thermal, and mechanical characterization of segmented-leg PbTe-based thermoelectric modules. This work featured a thermoelectric module measurement system that was constructed and used to measure 47-couple segmented thermoelectric power generation modules fabricated by Tellurex Corporation using n-type Bi 2Te 3-x Se x to Ag 0.86Pb 19+x SbTe 20 legs and p-type Bi x Sb 2-x Te 3 to Ag 0.9Pb 9Sn 9Sb 0.6Te 20 legs. The modules were measured under vacuum with hot-side and cold-side temperatures of approximately 670 K and 312 K, respectively. In addition, the measurements on the PbTe-based materials are compared with measurements performed on Bi 2Te 3 reference modules. Efficiency values as high as 6.56% were measured on these modules. In addition to the measurement system description and the measurement results on these modules, infrared images of the modules that were used to help identify nonuniformities are also presented.

Original languageEnglish
Pages (from-to)2051-2062
Number of pages12
JournalJournal of Electronic Materials
Volume40
Issue number10
DOIs
Publication statusPublished - Oct 1 2011

Keywords

  • Thermoelectric generator
  • efficiency measurements
  • power generation
  • segmented leg
  • waste heat recovery

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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  • Cite this

    D'Angelo, J., Case, E. D., Matchanov, N., Wu, C. I., Hogan, T. P., Barnard, J., Cauchy, C., Hendricks, T., & Kanatzidis, M. G. (2011). Electrical, thermal, and mechanical characterization of novel segmented-leg thermoelectric modules. Journal of Electronic Materials, 40(10), 2051-2062. https://doi.org/10.1007/s11664-011-1717-7